Microscopic model for static and dynamic loading of chiral sculptured thin films

Research output: Contribution to journalConference article

Abstract

The localized homogenization framework, the Mori-Tanaka average stress and the Eshelby tensor for ellipsoids are used to estimate the elastic constitutive properties of chiral sculptured thin films from their microstructural details. The devised model contains five arbitrary parameters, whose values can be decided upon by suitable experimentation. The responses of a chiral STF to static and dynamic loading along the axis of nonhomogeneity are presented.

Original languageEnglish (US)
Pages (from-to)121-127
Number of pages7
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume4467
DOIs
StatePublished - Jan 1 2001
EventComplex Mediums II: Beyond Linear Isotropic Dielectrics - San Diego, CA, United States
Duration: Jul 30 2001Aug 1 2001

Fingerprint

experimentation
homogenizing
ellipsoids
Tensors
Thin Films
inhomogeneity
tensors
Thin films
estimates
Ellipsoid
thin films
Homogenization
Experimentation
Tensor
Arbitrary
Model
Estimate
Framework

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

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abstract = "The localized homogenization framework, the Mori-Tanaka average stress and the Eshelby tensor for ellipsoids are used to estimate the elastic constitutive properties of chiral sculptured thin films from their microstructural details. The devised model contains five arbitrary parameters, whose values can be decided upon by suitable experimentation. The responses of a chiral STF to static and dynamic loading along the axis of nonhomogeneity are presented.",
author = "Akhlesh Lakhtakia",
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