Microstructural investigation of Pd/Pt/Au and Pd/Ru/Au ohmic contacts to InAlSb/InAs heterostructures for high electron mobility transistors

Q. Zhang, R. Dormaier, Suzanne E. Mohney

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)458-459
Number of pages2
JournalMicroscopy and Microanalysis
Volume14
Issue numberSUPPL. 2
DOIs
StatePublished - Aug 1 2008

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Ohmic contacts
High electron mobility transistors
high electron mobility transistors
Heterojunctions
electric contacts

All Science Journal Classification (ASJC) codes

  • Instrumentation

Cite this

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title = "Microstructural investigation of Pd/Pt/Au and Pd/Ru/Au ohmic contacts to InAlSb/InAs heterostructures for high electron mobility transistors",
author = "Q. Zhang and R. Dormaier and Mohney, {Suzanne E.}",
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Microstructural investigation of Pd/Pt/Au and Pd/Ru/Au ohmic contacts to InAlSb/InAs heterostructures for high electron mobility transistors. / Zhang, Q.; Dormaier, R.; Mohney, Suzanne E.

In: Microscopy and Microanalysis, Vol. 14, No. SUPPL. 2, 01.08.2008, p. 458-459.

Research output: Contribution to journalArticle

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