Microstructural investigation of Pd/Pt/Au and Pd/Ru/Au ohmic contacts to InAlSb/InAs heterostructures for high electron mobility transistors

Q. Zhang, R. Dormaier, S. Mohney

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)458-459
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
StatePublished - Aug 2008

All Science Journal Classification (ASJC) codes

  • Instrumentation

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