Microstructural investigation of Pd/Pt/Au and Pd/Ru/Au ohmic contacts to InAlSb/InAs heterostructures for high electron mobility transistors

Q. Zhang; R. Dormaier; Suzanne E. Mohney

doi:10.1017/S1431927608085280

Microstructural investigation of Pd/Pt/Au and Pd/Ru/Au ohmic contacts to InAlSb/InAs heterostructures for high electron mobility transistors

Q. Zhang, R. Dormaier, Suzanne E. Mohney

Research output: Contribution to journal › Article

Original language	English (US)
Pages (from-to)	458-459
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	14
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927608085280
State	Published - Aug 1 2008

All Science Journal Classification (ASJC) codes

Instrumentation

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10.1017/S1431927608085280

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Zhang, Q., Dormaier, R., & Mohney, S. E. (2008). Microstructural investigation of Pd/Pt/Au and Pd/Ru/Au ohmic contacts to InAlSb/InAs heterostructures for high electron mobility transistors. Microscopy and Microanalysis, 14(SUPPL. 2), 458-459. https://doi.org/10.1017/S1431927608085280

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