| Original language | English (US) |
|---|---|
| Pages (from-to) | 458-459 |
| Number of pages | 2 |
| Journal | Microscopy and Microanalysis |
| Volume | 14 |
| Issue number | SUPPL. 2 |
| DOIs | |
| State | Published - Aug 1 2008 |
Fingerprint
All Science Journal Classification (ASJC) codes
- Instrumentation
Cite this
}
Microstructural investigation of Pd/Pt/Au and Pd/Ru/Au ohmic contacts to InAlSb/InAs heterostructures for high electron mobility transistors. / Zhang, Q.; Dormaier, R.; Mohney, Suzanne E.
In: Microscopy and Microanalysis, Vol. 14, No. SUPPL. 2, 01.08.2008, p. 458-459.Research output: Contribution to journal › Article
TY - JOUR
T1 - Microstructural investigation of Pd/Pt/Au and Pd/Ru/Au ohmic contacts to InAlSb/InAs heterostructures for high electron mobility transistors
AU - Zhang, Q.
AU - Dormaier, R.
AU - Mohney, Suzanne E.
PY - 2008/8/1
Y1 - 2008/8/1
UR - http://www.scopus.com/inward/record.url?scp=49549111367&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=49549111367&partnerID=8YFLogxK
U2 - 10.1017/S1431927608085280
DO - 10.1017/S1431927608085280
M3 - Article
AN - SCOPUS:49549111367
VL - 14
SP - 458
EP - 459
JO - Microscopy and Microanalysis
JF - Microscopy and Microanalysis
SN - 1431-9276
IS - SUPPL. 2
ER -