Microstructure and creep behavior of silicon nitride and SiAlONs

Kevin M. Fox, John R. Hellmann

Research output: Contribution to journalArticlepeer-review

15 Scopus citations

Fingerprint

Dive into the research topics of 'Microstructure and creep behavior of silicon nitride and SiAlONs'. Together they form a unique fingerprint.

Chemical Compounds

Physics & Astronomy

Engineering & Materials Science

Business & Economics