Microstructure evolution during severe shear deformation at small length-scales

Saurabh Basu, M. Ravi Shankar

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Microstructure evolution during severe shear in micrometer-scale sample sizes is examined by performing large-strain machining experiments inside a scanning electron microscope. The effect of depths of cut ranging from 1 to 10 μm on the mechanics is examined using digital image correlation of secondary electron images. The resulting microstructure is characterized via electron backscattered diffraction, which shows that with shrinking length-scales the gradual microstructure refinement observed for deeper cuts is replaced by abrupt but sporadic refinement mechanisms.

Original languageEnglish (US)
Pages (from-to)51-54
Number of pages4
JournalScripta Materialia
Volume72-73
DOIs
StatePublished - Feb 1 2014

Fingerprint

Shear deformation
shear
microstructure
Microstructure
Electron diffraction
machining
micrometers
Mechanics
Machining
Electron microscopes
electron diffraction
electron microscopes
Scanning
scanning
Electrons
electrons
Experiments

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics

Cite this

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Microstructure evolution during severe shear deformation at small length-scales. / Basu, Saurabh; Shankar, M. Ravi.

In: Scripta Materialia, Vol. 72-73, 01.02.2014, p. 51-54.

Research output: Contribution to journalArticle

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