Microstructure evolution during severe shear deformation at small length-scales

Saurabh Basu, M. Ravi Shankar

Research output: Contribution to journalArticle

3 Scopus citations

Abstract

Microstructure evolution during severe shear in micrometer-scale sample sizes is examined by performing large-strain machining experiments inside a scanning electron microscope. The effect of depths of cut ranging from 1 to 10 μm on the mechanics is examined using digital image correlation of secondary electron images. The resulting microstructure is characterized via electron backscattered diffraction, which shows that with shrinking length-scales the gradual microstructure refinement observed for deeper cuts is replaced by abrupt but sporadic refinement mechanisms.

Original languageEnglish (US)
Pages (from-to)51-54
Number of pages4
JournalScripta Materialia
Volume72-73
DOIs
StatePublished - Feb 1 2014

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics

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