Microwave Cofiring of Base Metal Electrode Multilayer Capacitors

Y. Fang, Dinesh Kumar Agrawal, Michael T. Lanagan, Thomas R. Shrout, Clive A. Randall, M. Randall, A. Henderson

Research output: Contribution to conferencePaper

7 Scopus citations

Abstract

Multilayer capacitors (MLCs) with base metal electrodes were cofired by microwave processing. Commercial green chips of MLCs with nickel electrodes were used in the microwave sintering study. Binder burnout was carried out in a conventional furnace. The cofiring experiments were conducted in a multimode microwave cavity operating at 2.45GHz under an inert atmosphere. Microstructure of the microwave processed MLC was studied. The dielectric properties of the microwave sintered MLCs were measured and compared with those sintered by conventional processing. The results show that the properties of the microwave-sintered samples are comparable to or better than the conventional samples. Also the microwave processing was found to have enhanced sintering kinetics and lowered the processing temperature and time substantially.

Original languageEnglish (US)
Pages359-366
Number of pages8
StatePublished - May 10 2004
EventCeramic Materials and Multilayer Electronic Devices, Proceedings - Nashville, TN, United States
Duration: Apr 27 2003Apr 30 2003

Other

OtherCeramic Materials and Multilayer Electronic Devices, Proceedings
CountryUnited States
CityNashville, TN
Period4/27/034/30/03

All Science Journal Classification (ASJC) codes

  • Ceramics and Composites
  • Materials Chemistry

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    Fang, Y., Agrawal, D. K., Lanagan, M. T., Shrout, T. R., Randall, C. A., Randall, M., & Henderson, A. (2004). Microwave Cofiring of Base Metal Electrode Multilayer Capacitors. 359-366. Paper presented at Ceramic Materials and Multilayer Electronic Devices, Proceedings, Nashville, TN, United States.