Microwave dielectric properties and Raman spectroscopy of Scheelite solid solution [(Li0.5Bi0.5)1-xCax] MoO4 ceramics with ultra-low sintering temperatures

Di Zhou, Hong Wang, Qiu Ping Wang, Xin Guang Wu, Jing Guo, Gao Qun Zhang, Li Shui, Xi Yao, Clive A. Randall, Li Xia Pang, Han Chen Liu

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Abstract

A Scheelite solid solution was formed based on [(Li0.5Bi 0.5)1-xCax]MoO4 ceramics and prepared via a solid state reaction method in the range 0.0 ≤ x ≤ 1.0. High performance microwave dielectric properties were obtained in the [(Li 0.5Bi0.5)0.15Ca0.85]MoO4 ceramic sintered at 760°C with a relative permittivity of 14.1, a Qf value of 24,000 GHz (at 10.0 GHz), and a temperature coefficient value of +10.7 ppm/°C and the [(Li0.5Bi0.5)0.1Ca 0.9]MoO4 ceramic sintered at 850°C with a relative permittivity of 12.7, a Qf value of 41,300 GHz (at 10.3 GHz), and a temperature coefficient value of -16.5 ppm/°C. X-ray diffraction, Raman spectroscopy and the classical damped oscillator model were applied to study the relationship between the microwave dielectric properties and structures.

Original languageEnglish (US)
Pages (from-to)253-257
Number of pages5
JournalFunctional Materials Letters
Volume3
Issue number4
DOIs
StatePublished - Dec 1 2010

All Science Journal Classification (ASJC) codes

  • Materials Science(all)

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