Microwave imaging using ultra-wideband noise waveforms for nondestructive testing of multilayer structures

Marc D. Navagato, Ram M. Narayanan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

Ultrawideband noise signals have shown proven benefits in the realm of remote sensing for decades-aiding in the detection and localization of potentially harmful concealed objects. The characteristics of these waveforms show promise in the area of nondestructive testing for the detection of defects within multilayered structures. In this paper, we develop an approach to identify noise waveforms that will perform as effectively, or outperform, other common waveforms used in microwave imaging. Experimental data are gathered using a microwave imaging system operating in the X-band frequency range to detect the presence of water in dielectric materials and air voids in concrete walls reinforced with glass-fiber reinforced polymers.

Original languageEnglish (US)
Title of host publicationRadar Sensor Technology XXII
EditorsArmin Doerry, Kenneth I. Ranney
PublisherSPIE
ISBN (Electronic)9781510617773
DOIs
StatePublished - Jan 1 2018
EventRadar Sensor Technology XXII 2018 - Orlando, United States
Duration: Apr 16 2018Apr 18 2018

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10633
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherRadar Sensor Technology XXII 2018
CountryUnited States
CityOrlando
Period4/16/184/18/18

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Navagato, M. D., & Narayanan, R. M. (2018). Microwave imaging using ultra-wideband noise waveforms for nondestructive testing of multilayer structures. In A. Doerry, & K. I. Ranney (Eds.), Radar Sensor Technology XXII [1063314] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 10633). SPIE. https://doi.org/10.1117/12.2305850