Millimeter-Wave Backscatter Characteristics of Multilayered Snow Surfaces

Ram Mohan Narayanan, Robert E. Mcintosh

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

Backscatter measurements are presented of various snow packs made during the 1987-1988 winter season with a unique 215 GHz radar system. Measurements were made for VV, HH, VH, and HV polarizations. Concurrent ground truth measurements of snow surface roughness, moisture content, density, hardness, particle size, and grain type were also made. These measured ground truth parameters are used as inputs to a simple model developed based on geometrical optics and Mie scattering theory for comparison with the observed backscatter characteristics.

Original languageEnglish (US)
Pages (from-to)693-703
Number of pages11
JournalIEEE Transactions on Antennas and Propagation
Volume38
Issue number5
DOIs
StatePublished - Jan 1 1990

Fingerprint

snow
Snow
Millimeter waves
millimeter waves
ground truth
Geometrical optics
Mie scattering
geometrical optics
Radar systems
winter
moisture content
radar
surface roughness
Moisture
hardness
Surface roughness
Hardness
Particle size
Scattering
Polarization

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this

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Millimeter-Wave Backscatter Characteristics of Multilayered Snow Surfaces. / Narayanan, Ram Mohan; Mcintosh, Robert E.

In: IEEE Transactions on Antennas and Propagation, Vol. 38, No. 5, 01.01.1990, p. 693-703.

Research output: Contribution to journalArticle

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