Millimeter-wave backscatter measurements of various snow forms

Ram Mohan Narayanan, P. M. Langlois, P. W. Gaiser, R. E. McIntosh

Research output: Contribution to conferencePaper

Abstract

NRCS measurements of various snow profiles for VV, VH, HH, and HV polarizations at 215 GHz using ground based radar are presented. Snow ground-truth measurements were made concurrently with backscatter measurements in order to establish a physical relationship between the snow properties and radar data. External calibration was performed using a precision millimeter-wave trihedral corner deflector. The overall backsctter was modeled as arising due to surface scatter at the air-snow and snow-snow interfaces. The overall backscatter was modified to account for the shadowing effects of the rough surface. The results show that the model agrees with the measured data within the accuracy of the radar system without the use of any bestfit parameter. A combined backscatter model based on the surface and volume scattering theory together with shadowing corrections, is seen to agree with the measured data reasonably.

Original languageEnglish (US)
Pages451-452
Number of pages2
StatePublished - Sep 1 1988
EventIGARSS'88 - Remote Sensing: Moving towards the 21th Centure - Edinburgh, UK
Duration: Sep 12 1988Sep 16 1988

Other

OtherIGARSS'88 - Remote Sensing: Moving towards the 21th Centure
CityEdinburgh, UK
Period9/12/889/16/88

All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Earth and Planetary Sciences(all)

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  • Cite this

    Narayanan, R. M., Langlois, P. M., Gaiser, P. W., & McIntosh, R. E. (1988). Millimeter-wave backscatter measurements of various snow forms. 451-452. Paper presented at IGARSS'88 - Remote Sensing: Moving towards the 21th Centure, Edinburgh, UK, .