Model for channel hot carrier reliability degradation due to plasma damage in MOS devices

Sanjay Rangan, Srikanth Krishnan, Ajith Amerasekara, Shian Aur, S Ashok

Research output: Chapter in Book/Report/Conference proceedingConference contribution

10 Scopus citations

Fingerprint

Dive into the research topics of 'Model for channel hot carrier reliability degradation due to plasma damage in MOS devices'. Together they form a unique fingerprint.

Engineering & Materials Science