Modeling and simulation of milling frozen biological samples by focused ion beam

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Focused Ion Beam (FIB) has been used widely for sample preparation in material research and nanoscale device fabrication. The introduction of FIB system to biological samples preparation, especially for frozen samples, provides the potential to produce delicate submicron geometries on the samples, as well as the potential to be fully digitally controlled. In this paper, we first study the ion interactions with water and different cryoprotectants, and the sputtering yields under different conditions are estimated as the milling rate. A geometric simulation model is also proposed which can be used as a process planning tool to perform cryo-sectioning by FIB. Finally, discussions and suggestions for future work are presented.

Original languageEnglish (US)
Title of host publication2007 Proceedings of the ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, DETC2007
Pages905-912
Number of pages8
DOIs
StatePublished - Jun 13 2008
Event19th Int. Conf. Design Theory and Methodology and 1st Int. Conf. Micro and Nano Systems, presented at - 2007 ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, IDETC/CIE2007 - Las Vegas, NV, United States
Duration: Sep 4 2007Sep 7 2007

Publication series

Name2007 Proceedings of the ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, DETC2007
Volume3 PART B

Other

Other19th Int. Conf. Design Theory and Methodology and 1st Int. Conf. Micro and Nano Systems, presented at - 2007 ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, IDETC/CIE2007
CountryUnited States
CityLas Vegas, NV
Period9/4/079/7/07

Fingerprint

Focused ion beams
Modeling and Simulation
Preparation
Process planning
Sputtering
Process Planning
Geometric Model
Fabrication
Simulation Model
Geometry
Ions
Water
Interaction

All Science Journal Classification (ASJC) codes

  • Computer Graphics and Computer-Aided Design
  • Computer Science Applications
  • Mechanical Engineering
  • Modeling and Simulation

Cite this

Fu, J., Catchmark, J. M., & Joshi, S. B. (2008). Modeling and simulation of milling frozen biological samples by focused ion beam. In 2007 Proceedings of the ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, DETC2007 (pp. 905-912). (2007 Proceedings of the ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, DETC2007; Vol. 3 PART B). https://doi.org/10.1115/DETC2007-35209
Fu, Jing ; Catchmark, Jeffrey M. ; Joshi, Sanjay B. / Modeling and simulation of milling frozen biological samples by focused ion beam. 2007 Proceedings of the ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, DETC2007. 2008. pp. 905-912 (2007 Proceedings of the ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, DETC2007).
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abstract = "Focused Ion Beam (FIB) has been used widely for sample preparation in material research and nanoscale device fabrication. The introduction of FIB system to biological samples preparation, especially for frozen samples, provides the potential to produce delicate submicron geometries on the samples, as well as the potential to be fully digitally controlled. In this paper, we first study the ion interactions with water and different cryoprotectants, and the sputtering yields under different conditions are estimated as the milling rate. A geometric simulation model is also proposed which can be used as a process planning tool to perform cryo-sectioning by FIB. Finally, discussions and suggestions for future work are presented.",
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Fu, J, Catchmark, JM & Joshi, SB 2008, Modeling and simulation of milling frozen biological samples by focused ion beam. in 2007 Proceedings of the ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, DETC2007. 2007 Proceedings of the ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, DETC2007, vol. 3 PART B, pp. 905-912, 19th Int. Conf. Design Theory and Methodology and 1st Int. Conf. Micro and Nano Systems, presented at - 2007 ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, IDETC/CIE2007, Las Vegas, NV, United States, 9/4/07. https://doi.org/10.1115/DETC2007-35209

Modeling and simulation of milling frozen biological samples by focused ion beam. / Fu, Jing; Catchmark, Jeffrey M.; Joshi, Sanjay B.

2007 Proceedings of the ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, DETC2007. 2008. p. 905-912 (2007 Proceedings of the ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, DETC2007; Vol. 3 PART B).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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AB - Focused Ion Beam (FIB) has been used widely for sample preparation in material research and nanoscale device fabrication. The introduction of FIB system to biological samples preparation, especially for frozen samples, provides the potential to produce delicate submicron geometries on the samples, as well as the potential to be fully digitally controlled. In this paper, we first study the ion interactions with water and different cryoprotectants, and the sputtering yields under different conditions are estimated as the milling rate. A geometric simulation model is also proposed which can be used as a process planning tool to perform cryo-sectioning by FIB. Finally, discussions and suggestions for future work are presented.

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Fu J, Catchmark JM, Joshi SB. Modeling and simulation of milling frozen biological samples by focused ion beam. In 2007 Proceedings of the ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, DETC2007. 2008. p. 905-912. (2007 Proceedings of the ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, DETC2007). https://doi.org/10.1115/DETC2007-35209