The functional form of the time decay of the remanent polarization under high-electrical drives, known as fatigue, has been derived for relaxor piezoelectric materials based on the hierarchical relaxation process, typical of disordered systems such as random-field and glassy states and is given in terms of normalized remanent polarization (P̄ r) as P̄ r(t)=P̄ ot -xexp[-c(t/τ) β]. This function was verified by fitting the dynamics of the fatigue behavior in 0.92Pb(Zn 1/3Nb 2/3)O 3-0.08PbTiO 3 (PZN-PT) relaxor-based piezoelectric system. Mn modification of a PZN-PT single crystal improved the fatigue behavior by slowing down the relaxation processes and pinning the domain wall motion.
|Original language||English (US)|
|Number of pages||5|
|Journal||Journal of Applied Physics|
|State||Published - Oct 1 2002|
All Science Journal Classification (ASJC) codes
- Physics and Astronomy(all)