Modeling of fatigue behavior in relaxor piezocrystals: Improved characteristics by Mn substitution

Shashank Priya, Hyeoung Woo Kim, Jungho Ryu, Shujun Zhang, Thomas R. Shrout, Kenji Uchino

Research output: Contribution to journalArticle

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Abstract

The functional form of the time decay of the remanent polarization under high-electrical drives, known as fatigue, has been derived for relaxor piezoelectric materials based on the hierarchical relaxation process, typical of disordered systems such as random-field and glassy states and is given in terms of normalized remanent polarization (P̄ r) as P̄ r(t)=P̄ ot -xexp[-c(t/τ) β]. This function was verified by fitting the dynamics of the fatigue behavior in 0.92Pb(Zn 1/3Nb 2/3)O 3-0.08PbTiO 3 (PZN-PT) relaxor-based piezoelectric system. Mn modification of a PZN-PT single crystal improved the fatigue behavior by slowing down the relaxation processes and pinning the domain wall motion.

Original languageEnglish (US)
Pages (from-to)3923-3927
Number of pages5
JournalJournal of Applied Physics
Volume92
Issue number7
DOIs
Publication statusPublished - Oct 1 2002

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All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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