Modeling of fatigue behavior in relaxor piezocrystals

Improved characteristics by Mn substitution

Shashank Priya, Hyeoung Woo Kim, Jungho Ryu, Shujun Zhang, Thomas R. Shrout, Kenji Uchino

Research output: Contribution to journalArticle

16 Citations (Scopus)

Abstract

The functional form of the time decay of the remanent polarization under high-electrical drives, known as fatigue, has been derived for relaxor piezoelectric materials based on the hierarchical relaxation process, typical of disordered systems such as random-field and glassy states and is given in terms of normalized remanent polarization (P̄ r) as P̄ r(t)=P̄ ot -xexp[-c(t/τ) β]. This function was verified by fitting the dynamics of the fatigue behavior in 0.92Pb(Zn 1/3Nb 2/3)O 3-0.08PbTiO 3 (PZN-PT) relaxor-based piezoelectric system. Mn modification of a PZN-PT single crystal improved the fatigue behavior by slowing down the relaxation processes and pinning the domain wall motion.

Original languageEnglish (US)
Pages (from-to)3923-3927
Number of pages5
JournalJournal of Applied Physics
Volume92
Issue number7
DOIs
StatePublished - Oct 1 2002

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substitutes
polarization
domain wall
single crystals
decay

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

Priya, Shashank ; Kim, Hyeoung Woo ; Ryu, Jungho ; Zhang, Shujun ; Shrout, Thomas R. ; Uchino, Kenji. / Modeling of fatigue behavior in relaxor piezocrystals : Improved characteristics by Mn substitution. In: Journal of Applied Physics. 2002 ; Vol. 92, No. 7. pp. 3923-3927.
@article{9e57f0e829124693adca70af31d49ae0,
title = "Modeling of fatigue behavior in relaxor piezocrystals: Improved characteristics by Mn substitution",
abstract = "The functional form of the time decay of the remanent polarization under high-electrical drives, known as fatigue, has been derived for relaxor piezoelectric materials based on the hierarchical relaxation process, typical of disordered systems such as random-field and glassy states and is given in terms of normalized remanent polarization (P̄ r) as P̄ r(t)=P̄ ot -xexp[-c(t/τ) β]. This function was verified by fitting the dynamics of the fatigue behavior in 0.92Pb(Zn 1/3Nb 2/3)O 3-0.08PbTiO 3 (PZN-PT) relaxor-based piezoelectric system. Mn modification of a PZN-PT single crystal improved the fatigue behavior by slowing down the relaxation processes and pinning the domain wall motion.",
author = "Shashank Priya and Kim, {Hyeoung Woo} and Jungho Ryu and Shujun Zhang and Shrout, {Thomas R.} and Kenji Uchino",
year = "2002",
month = "10",
day = "1",
doi = "10.1063/1.1503411",
language = "English (US)",
volume = "92",
pages = "3923--3927",
journal = "Journal of Applied Physics",
issn = "0021-8979",
publisher = "American Institute of Physics Publising LLC",
number = "7",

}

Modeling of fatigue behavior in relaxor piezocrystals : Improved characteristics by Mn substitution. / Priya, Shashank; Kim, Hyeoung Woo; Ryu, Jungho; Zhang, Shujun; Shrout, Thomas R.; Uchino, Kenji.

In: Journal of Applied Physics, Vol. 92, No. 7, 01.10.2002, p. 3923-3927.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Modeling of fatigue behavior in relaxor piezocrystals

T2 - Improved characteristics by Mn substitution

AU - Priya, Shashank

AU - Kim, Hyeoung Woo

AU - Ryu, Jungho

AU - Zhang, Shujun

AU - Shrout, Thomas R.

AU - Uchino, Kenji

PY - 2002/10/1

Y1 - 2002/10/1

N2 - The functional form of the time decay of the remanent polarization under high-electrical drives, known as fatigue, has been derived for relaxor piezoelectric materials based on the hierarchical relaxation process, typical of disordered systems such as random-field and glassy states and is given in terms of normalized remanent polarization (P̄ r) as P̄ r(t)=P̄ ot -xexp[-c(t/τ) β]. This function was verified by fitting the dynamics of the fatigue behavior in 0.92Pb(Zn 1/3Nb 2/3)O 3-0.08PbTiO 3 (PZN-PT) relaxor-based piezoelectric system. Mn modification of a PZN-PT single crystal improved the fatigue behavior by slowing down the relaxation processes and pinning the domain wall motion.

AB - The functional form of the time decay of the remanent polarization under high-electrical drives, known as fatigue, has been derived for relaxor piezoelectric materials based on the hierarchical relaxation process, typical of disordered systems such as random-field and glassy states and is given in terms of normalized remanent polarization (P̄ r) as P̄ r(t)=P̄ ot -xexp[-c(t/τ) β]. This function was verified by fitting the dynamics of the fatigue behavior in 0.92Pb(Zn 1/3Nb 2/3)O 3-0.08PbTiO 3 (PZN-PT) relaxor-based piezoelectric system. Mn modification of a PZN-PT single crystal improved the fatigue behavior by slowing down the relaxation processes and pinning the domain wall motion.

UR - http://www.scopus.com/inward/record.url?scp=18644386774&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=18644386774&partnerID=8YFLogxK

U2 - 10.1063/1.1503411

DO - 10.1063/1.1503411

M3 - Article

VL - 92

SP - 3923

EP - 3927

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

IS - 7

ER -