Modeling perturbations induced in plate resonator characteristics due to flexural bending

Gokhan Hatipoglu, Srinivas A. Tadigadapa

Research output: Contribution to journalArticle

1 Scopus citations

Abstract

In this work, the changes in frequency occurring in thickness-shear mode quartz resonators due to bending are discussed and modeled. First order strain gradients and second and third order elastic coefficients for micromachined thin plate quartz resonators are important in the calculation of the frequency shifts. These gradients and coefficients are summarized and derived using Lee's theory. This theory is later combined with quartz/magnetostrictive layer unimorphs, where the tip deflection formulations are given. As a case study, the theoretical frequency shifts in a micromachined quartz resonator laminated with magnetostrictive thin film is calculated and later compared with experimental data. The combined model fits well with the experiments.

Original languageEnglish (US)
Article number6985337
Pages (from-to)1652-1655
Number of pages4
JournalProceedings of IEEE Sensors
Volume2014-December
Issue numberDecember
DOIs
StatePublished - Dec 12 2014

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Modeling perturbations induced in plate resonator characteristics due to flexural bending'. Together they form a unique fingerprint.

  • Cite this