Modeling soft errors at the device and logic levels for combinational circuits

Rajaraman Ramanarayanan, Vijay Sai Degalahal, Ramakrishnan Krishnan, Jungsub Kim, Vijaykrishnan Narayanan, Yuan Xie, Mary Jane Irwin, Kenan Unlu

Research output: Contribution to journalArticlepeer-review

36 Scopus citations

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Engineering & Materials Science