Zn:Se flux ratio has a strong impact on the transport properties of buried two-dimensional electron gases (2DEGs), and can be correlated with the final surface morphology of the samples. The use of atomic force microscopy (AFM) as a diagnostic tool provides useful and efficient feedback about the sample quality. Optimized growth conditions have resulted in a roughly two-fold improvement in the low temperature mobility of both magnetic and nonmagnetic ZnSe-based 2DEGs.
|Original language||English (US)|
|Number of pages||5|
|Journal||Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures|
|State||Published - May 2000|
All Science Journal Classification (ASJC) codes
- Condensed Matter Physics
- Electrical and Electronic Engineering