Molecular dynamics computer simulations of 5 keV C60 bombardment of benzene crystal

Bartlomiej Czerwinski, Lukasz Rzeznik, Robert Paruch, Barbara J. Garrison, Zbigniew Postawa

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Abstract

Coarse-grained molecular dynamics computer simulations have been used to investigate the damage of a benzene crystal induced by 5 keV C60 projectile bombardment. The sputtering yield, mass distributions and the depth distributions of ejected organic molecules are analyzed. The temporal evolution of the system reveals that impinging C60 cluster leads to creation of almost hemispherical crater. Most of the molecules damaged by the projectile impact are ejected into the vacuum during cluster irradiation. This "cleaning up" effect may explain why secondary ion mass spectrometry (SIMS) analysis of some organic samples with cluster projectiles can produce significantly less accumulated damage compared to analysis performed with atomic ion beams.

Original languageEnglish (US)
Pages (from-to)S95-S98
JournalVacuum
Volume83
Issue numberSUPPL.1
DOIs
StatePublished - May 1 2009

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Condensed Matter Physics
  • Surfaces, Coatings and Films

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    Czerwinski, B., Rzeznik, L., Paruch, R., Garrison, B. J., & Postawa, Z. (2009). Molecular dynamics computer simulations of 5 keV C60 bombardment of benzene crystal. Vacuum, 83(SUPPL.1), S95-S98. https://doi.org/10.1016/j.vacuum.2009.01.034