TY - JOUR
T1 - Molecular dynamics computer simulations of 5 keV C60 bombardment of benzene crystal
AU - Czerwinski, Bartlomiej
AU - Rzeznik, Lukasz
AU - Paruch, Robert
AU - Garrison, Barbara J.
AU - Postawa, Zbigniew
N1 - Funding Information:
The financial support from the Polish Ministry of Science and Higher Education programs no. PB 4097/H03/2007/33 and PB 0935/B/H03/2008/35, and the National Science Foundation grant #CHE-0456514 are gratefully acknowledged.
Copyright:
Copyright 2009 Elsevier B.V., All rights reserved.
PY - 2009/5/1
Y1 - 2009/5/1
N2 - Coarse-grained molecular dynamics computer simulations have been used to investigate the damage of a benzene crystal induced by 5 keV C60 projectile bombardment. The sputtering yield, mass distributions and the depth distributions of ejected organic molecules are analyzed. The temporal evolution of the system reveals that impinging C60 cluster leads to creation of almost hemispherical crater. Most of the molecules damaged by the projectile impact are ejected into the vacuum during cluster irradiation. This "cleaning up" effect may explain why secondary ion mass spectrometry (SIMS) analysis of some organic samples with cluster projectiles can produce significantly less accumulated damage compared to analysis performed with atomic ion beams.
AB - Coarse-grained molecular dynamics computer simulations have been used to investigate the damage of a benzene crystal induced by 5 keV C60 projectile bombardment. The sputtering yield, mass distributions and the depth distributions of ejected organic molecules are analyzed. The temporal evolution of the system reveals that impinging C60 cluster leads to creation of almost hemispherical crater. Most of the molecules damaged by the projectile impact are ejected into the vacuum during cluster irradiation. This "cleaning up" effect may explain why secondary ion mass spectrometry (SIMS) analysis of some organic samples with cluster projectiles can produce significantly less accumulated damage compared to analysis performed with atomic ion beams.
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U2 - 10.1016/j.vacuum.2009.01.034
DO - 10.1016/j.vacuum.2009.01.034
M3 - Article
AN - SCOPUS:67349241657
VL - 83
SP - S95-S98
JO - Vacuum
JF - Vacuum
SN - 0042-207X
IS - SUPPL.1
ER -