Depth profiling experiments using secondary ion spectrometry (SIMS) have shown effects that are characteristic to the pairing of the C60+ projectile with a Si target. Previous molecular dynamics simulations demonstrate that this unusual behavior is due to the fact that strong covalent bonds are formed between the C atoms in the projectile and the Si atoms in the target, which result in the implantation of carbon into the solid. The focus of this paper is to understand how the formation of chemical bonds affects the net sputtered yield. The results of molecular dynamics simulations of the keV bombardment of Si with C60, Ne60 and 12Ne60 at normal incidence are compared over a range of incident kinetic energies from 5 to 20 keV. The net yields with Ne60 and 12Ne60 are significantly greater than with C60 at all incident kinetic energies, with 12Ne60 having the largest values. Application of the mesoscale energy deposition footprint (MEDF) model shows that the initial deposition of energy into the substrate is similar with all three projectiles. Snapshots of the initial pathway of the projectile atoms through the substrate show a similar lateral and vertical distribution that is centered in the region of the energy footprint. Therefore, the reason for the reduced yield with C60 is that the C atoms form bonds with the Si atoms, which causes them to remain in the substrate instead of being sputtered.
|Original language||English (US)|
|Number of pages||4|
|Journal||Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms|
|State||Published - Feb 1 2009|
All Science Journal Classification (ASJC) codes
- Nuclear and High Energy Physics