Morphology of amorphous pockets in SiC irradiated with 1 MeV Kr ions

Xing Wang, Laura Jamison, Kumar Sridharan, Paul M. Voyles, Dane Morgan, Izabela Szlufarska

Research output: Contribution to journalConference article

Original languageEnglish (US)
Pages (from-to)1830-1831
Number of pages2
JournalMicroscopy and Microanalysis
Volume20
Issue number3
DOIs
StatePublished - Aug 1 2014
EventMicroscopy and Microanalysis 2014, M and M 2014 - Hartford, United States
Duration: Aug 3 2014Aug 7 2014

All Science Journal Classification (ASJC) codes

  • Instrumentation

Cite this

Wang, X., Jamison, L., Sridharan, K., Voyles, P. M., Morgan, D., & Szlufarska, I. (2014). Morphology of amorphous pockets in SiC irradiated with 1 MeV Kr ions. Microscopy and Microanalysis, 20(3), 1830-1831. https://doi.org/10.1017/S1431927614010885