Multifractal characterization of nonstationarity and intermittency of cloud base height signals

N. Gospodinova, K. Ivanova, Eugene Edmund Clothiaux, T. Ackerman

Research output: Contribution to journalArticle

Abstract

Cloud base profiles measured with laser ceilometer are studied using multifractal approach. The method assesses nonstationarity and intermittency pertinent to such highly fluctuating signals. The irregular structure of the signals is a benchmark for non-linear dynamics processes. The analysis searches for the scaling properties of q-th order singular measures and q-th order structure functions. Therefore, the method seeks for various scales of self-affinity, i.e. searches for multi-affinity. We found that multifractality is the signature of the cloud base height profiles, characterized with a hierarchy of exponems q H(q) and K(q). The value of the roughness parameter H1 is consistent with the one obtained for the same data using different method of analysis. The multifractal behavior is consistent also with the multi-affine properties of other atmospheric data recorded simultaneously during the same field experimemt ASTEX'92.

Original languageEnglish (US)
Pages (from-to)476-480
Number of pages5
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume4397
DOIs
StatePublished - Jan 1 2001

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Nonstationarity
Intermittency
intermittency
affinity
cloud height indicators
Surface roughness
Lasers
profiles
Self-affinity
Singular Measures
hierarchies
Multifractality
roughness
Nonlinear Process
signatures
Dynamic Process
Structure-function
scaling
Roughness
Nonlinear Dynamics

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

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Multifractal characterization of nonstationarity and intermittency of cloud base height signals. / Gospodinova, N.; Ivanova, K.; Clothiaux, Eugene Edmund; Ackerman, T.

In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 4397, 01.01.2001, p. 476-480.

Research output: Contribution to journalArticle

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