Multiplexing and M# measurement in spectral hole burning medium

Zhiwen Liu, W. Liu, C. Moser, D. Zhang, I. V. Solomatine, D. Psaltis, A. Gorokhovsky

Research output: Contribution to conferencePaperpeer-review

Abstract

The hologram diffraction efficiency obtained using multiplexing M holograms at a single location and frequency which is given by M/# was measured in spectral hole burning medium. Single plane wave holograms were recorded at different wavelengths with both the reference and the signal intensity of 10 μW/cm2. The measured angular selectivity was about 0.6 degree which agrees with the theoretical results calculated from the thickness of the material. The measured M/# was about 0.01 which was of the same order of magnitude with the computed M/# (0.02).

Original languageEnglish (US)
Number of pages1
StatePublished - Oct 8 2001
EventConference on Lasers and Electro-Optics (CLEO) - Baltimore, MD, United States
Duration: May 6 2001May 11 2001

Other

OtherConference on Lasers and Electro-Optics (CLEO)
Country/TerritoryUnited States
CityBaltimore, MD
Period5/6/015/11/01

All Science Journal Classification (ASJC) codes

  • Control and Systems Engineering
  • Electrical and Electronic Engineering

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