Nanocrystalline Sr2CeO4 thin films grown on silicon by laser ablation

Néstor Perea, G. A. Hirata

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

Blue-white luminescent Sr2CeO4 thin films were deposited by using pulsed laser ablation (λ = 248 nm wavelength) on 500 °C silicon (111) substrates under an oxygen pressure of 55 mTorr. High-resolution electron transmission microscopy, electron diffraction and X-ray diffraction analysis revealed that the films were composed of nanocrystalline Sr2CeO4 grains of the order of 20-30 nm with a preferential orientation in the (130) crystallographic direction. The excitation and photoluminescence spectra measured on the films maintained the characteristic emission of bulk Sr2CeO4 however, the emission peak appeared narrower and blue-shifted as compared to the luminescence spectrum of the target. The blue-shift and a preferential crystallographic orientation during the growth formation of the film is related to the nanocrystalline nature of the grains due to the quantum confinement behavior and surface energy minimization in nanostructured systems.

Original languageEnglish (US)
Pages (from-to)177-181
Number of pages5
JournalThin Solid Films
Volume497
Issue number1-2
DOIs
StatePublished - Feb 21 2006

Fingerprint

Silicon
Laser ablation
laser ablation
Thin films
silicon
thin films
Quantum confinement
High resolution transmission electron microscopy
Pulsed lasers
Interfacial energy
blue shift
Electron diffraction
X ray diffraction analysis
surface energy
Luminescence
pulsed lasers
Photoluminescence
electron diffraction
luminescence
Oxygen

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

Cite this

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abstract = "Blue-white luminescent Sr2CeO4 thin films were deposited by using pulsed laser ablation (λ = 248 nm wavelength) on 500 °C silicon (111) substrates under an oxygen pressure of 55 mTorr. High-resolution electron transmission microscopy, electron diffraction and X-ray diffraction analysis revealed that the films were composed of nanocrystalline Sr2CeO4 grains of the order of 20-30 nm with a preferential orientation in the (130) crystallographic direction. The excitation and photoluminescence spectra measured on the films maintained the characteristic emission of bulk Sr2CeO4 however, the emission peak appeared narrower and blue-shifted as compared to the luminescence spectrum of the target. The blue-shift and a preferential crystallographic orientation during the growth formation of the film is related to the nanocrystalline nature of the grains due to the quantum confinement behavior and surface energy minimization in nanostructured systems.",
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Nanocrystalline Sr2CeO4 thin films grown on silicon by laser ablation. / Perea, Néstor; Hirata, G. A.

In: Thin Solid Films, Vol. 497, No. 1-2, 21.02.2006, p. 177-181.

Research output: Contribution to journalArticle

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