Nanometer-level axis of rotation metrology for a high-precision macromolecular X-ray diffractometer

B. Knapp, Eric Russell Marsh, F. Cipriani, D. Arneson, D. Oss, M. Liebers, E. Keller

    Research output: Contribution to journalConference article

    1 Citation (Scopus)

    Abstract

    The availability of micro-focused beams at 3rd generation synchrotrons makes collecting X-ray data from macromolecular crystals down to a fraction of micron size possible. This requires using goniometers with nanometer-level errors. Crystal positioning is typically realized with a multi-axis goniometer designed to minimize error motion during rotation of the crystal by the data-collection axis. In this paper, five degree-of-freedom error motions of an air bearing diffractometer data-collection axis are evaluated using a multiprobe method. As spindle errors and artifact out-of-roundness approach equal magnitudes, techniques must be used to distinguish and separate each error. A purpose-built fixture orients a single capacitive sensor in three asymmetrical positions to separate artifact form error from spindle error motion. Metrology results of this air bearing Omega spindle demonstrate synchronous errors of 16 nm radial, 4 nm axial and 0.28 μrad tilt.

    Original languageEnglish (US)
    Article number012012
    JournalJournal of Physics: Conference Series
    Volume425
    Issue numberPART 1
    DOIs
    StatePublished - Jan 1 2013
    Event11th International Conference on Synchrotron Radiation Instrumentation, SRI 2012 - Lyon, France
    Duration: Jul 9 2012Jul 13 2012

    Fingerprint

    axes of rotation
    diffractometers
    metrology
    spindles
    x rays
    goniometers
    gas bearings
    artifacts
    crystals
    fixtures
    positioning
    availability
    synchrotrons
    degrees of freedom
    sensors

    All Science Journal Classification (ASJC) codes

    • Physics and Astronomy(all)

    Cite this

    Knapp, B. ; Marsh, Eric Russell ; Cipriani, F. ; Arneson, D. ; Oss, D. ; Liebers, M. ; Keller, E. / Nanometer-level axis of rotation metrology for a high-precision macromolecular X-ray diffractometer. In: Journal of Physics: Conference Series. 2013 ; Vol. 425, No. PART 1.
    @article{035be748fa544c11a1ef4d607e2b4f96,
    title = "Nanometer-level axis of rotation metrology for a high-precision macromolecular X-ray diffractometer",
    abstract = "The availability of micro-focused beams at 3rd generation synchrotrons makes collecting X-ray data from macromolecular crystals down to a fraction of micron size possible. This requires using goniometers with nanometer-level errors. Crystal positioning is typically realized with a multi-axis goniometer designed to minimize error motion during rotation of the crystal by the data-collection axis. In this paper, five degree-of-freedom error motions of an air bearing diffractometer data-collection axis are evaluated using a multiprobe method. As spindle errors and artifact out-of-roundness approach equal magnitudes, techniques must be used to distinguish and separate each error. A purpose-built fixture orients a single capacitive sensor in three asymmetrical positions to separate artifact form error from spindle error motion. Metrology results of this air bearing Omega spindle demonstrate synchronous errors of 16 nm radial, 4 nm axial and 0.28 μrad tilt.",
    author = "B. Knapp and Marsh, {Eric Russell} and F. Cipriani and D. Arneson and D. Oss and M. Liebers and E. Keller",
    year = "2013",
    month = "1",
    day = "1",
    doi = "10.1088/1742-6596/425/1/012012",
    language = "English (US)",
    volume = "425",
    journal = "Journal of Physics: Conference Series",
    issn = "1742-6588",
    publisher = "IOP Publishing Ltd.",
    number = "PART 1",

    }

    Nanometer-level axis of rotation metrology for a high-precision macromolecular X-ray diffractometer. / Knapp, B.; Marsh, Eric Russell; Cipriani, F.; Arneson, D.; Oss, D.; Liebers, M.; Keller, E.

    In: Journal of Physics: Conference Series, Vol. 425, No. PART 1, 012012, 01.01.2013.

    Research output: Contribution to journalConference article

    TY - JOUR

    T1 - Nanometer-level axis of rotation metrology for a high-precision macromolecular X-ray diffractometer

    AU - Knapp, B.

    AU - Marsh, Eric Russell

    AU - Cipriani, F.

    AU - Arneson, D.

    AU - Oss, D.

    AU - Liebers, M.

    AU - Keller, E.

    PY - 2013/1/1

    Y1 - 2013/1/1

    N2 - The availability of micro-focused beams at 3rd generation synchrotrons makes collecting X-ray data from macromolecular crystals down to a fraction of micron size possible. This requires using goniometers with nanometer-level errors. Crystal positioning is typically realized with a multi-axis goniometer designed to minimize error motion during rotation of the crystal by the data-collection axis. In this paper, five degree-of-freedom error motions of an air bearing diffractometer data-collection axis are evaluated using a multiprobe method. As spindle errors and artifact out-of-roundness approach equal magnitudes, techniques must be used to distinguish and separate each error. A purpose-built fixture orients a single capacitive sensor in three asymmetrical positions to separate artifact form error from spindle error motion. Metrology results of this air bearing Omega spindle demonstrate synchronous errors of 16 nm radial, 4 nm axial and 0.28 μrad tilt.

    AB - The availability of micro-focused beams at 3rd generation synchrotrons makes collecting X-ray data from macromolecular crystals down to a fraction of micron size possible. This requires using goniometers with nanometer-level errors. Crystal positioning is typically realized with a multi-axis goniometer designed to minimize error motion during rotation of the crystal by the data-collection axis. In this paper, five degree-of-freedom error motions of an air bearing diffractometer data-collection axis are evaluated using a multiprobe method. As spindle errors and artifact out-of-roundness approach equal magnitudes, techniques must be used to distinguish and separate each error. A purpose-built fixture orients a single capacitive sensor in three asymmetrical positions to separate artifact form error from spindle error motion. Metrology results of this air bearing Omega spindle demonstrate synchronous errors of 16 nm radial, 4 nm axial and 0.28 μrad tilt.

    UR - http://www.scopus.com/inward/record.url?scp=84876208546&partnerID=8YFLogxK

    UR - http://www.scopus.com/inward/citedby.url?scp=84876208546&partnerID=8YFLogxK

    U2 - 10.1088/1742-6596/425/1/012012

    DO - 10.1088/1742-6596/425/1/012012

    M3 - Conference article

    AN - SCOPUS:84876208546

    VL - 425

    JO - Journal of Physics: Conference Series

    JF - Journal of Physics: Conference Series

    SN - 1742-6588

    IS - PART 1

    M1 - 012012

    ER -