Nanoscale Characterization of Gold Colloid Monolayers

A Comparison of Four Techniques

Katherine C. Grabar, Kenneth R. Brown, Christine Dolan Keating, Stephan J. Stranick, Sau Lan Tang, Michael J. Natan

Research output: Contribution to journalArticle

198 Citations (Scopus)

Abstract

Atomic force microscopy (AFM), field emission scanning electron microscopy (FE-SEM), transmission electron microscopy (TEM), and near-field scanning optical microscopy (NSOM) have been used to characterize the nanostructure of Au colloid-based surfaces. Because these substrates are composed of particles whose dimensions are known prior to assembly, they are well-suited for a critical comparison of the capabilities and limitations of each nanoscale imaging technique. The three criteria for this comparison, which are relevant to the field of nanoparticle assemblies in general, are (i) accuracy in establishing particle size, particle coverage, and interparticle spacing; (ii) accuracy in delineating surface topography; and (iii) ease of sample preparation, data acquisition, and image analysis. For colloidal Au arrays, TEM gives the most reliable size and spacing information but exhibits the greatest constraints with regard to sample preparation; in contrast, AFM is widely applicable but yields data that are the least straightforward to interpret For accurate information regarding nanometer-scale architecture of particle-based surfaces, a combination of at least one scanning probe method (AFM, NSOM) and one accelerated-electron method (TEM, FE-SEM) is required.

Original languageEnglish (US)
Pages (from-to)471-477
Number of pages7
JournalAnalytical Chemistry
Volume69
Issue number3
DOIs
StatePublished - Jan 1 1997

Fingerprint

Gold Colloid
Near field scanning optical microscopy
Monolayers
Atomic force microscopy
Transmission electron microscopy
Field emission
Scanning electron microscopy
Colloids
Surface topography
Image analysis
Nanostructures
Data acquisition
Particle size
Nanoparticles
Scanning
Imaging techniques
Electrons
Substrates

All Science Journal Classification (ASJC) codes

  • Analytical Chemistry

Cite this

Grabar, Katherine C. ; Brown, Kenneth R. ; Keating, Christine Dolan ; Stranick, Stephan J. ; Tang, Sau Lan ; Natan, Michael J. / Nanoscale Characterization of Gold Colloid Monolayers : A Comparison of Four Techniques. In: Analytical Chemistry. 1997 ; Vol. 69, No. 3. pp. 471-477.
@article{1b1b3e4ef97d4debae530bec71cc609d,
title = "Nanoscale Characterization of Gold Colloid Monolayers: A Comparison of Four Techniques",
abstract = "Atomic force microscopy (AFM), field emission scanning electron microscopy (FE-SEM), transmission electron microscopy (TEM), and near-field scanning optical microscopy (NSOM) have been used to characterize the nanostructure of Au colloid-based surfaces. Because these substrates are composed of particles whose dimensions are known prior to assembly, they are well-suited for a critical comparison of the capabilities and limitations of each nanoscale imaging technique. The three criteria for this comparison, which are relevant to the field of nanoparticle assemblies in general, are (i) accuracy in establishing particle size, particle coverage, and interparticle spacing; (ii) accuracy in delineating surface topography; and (iii) ease of sample preparation, data acquisition, and image analysis. For colloidal Au arrays, TEM gives the most reliable size and spacing information but exhibits the greatest constraints with regard to sample preparation; in contrast, AFM is widely applicable but yields data that are the least straightforward to interpret For accurate information regarding nanometer-scale architecture of particle-based surfaces, a combination of at least one scanning probe method (AFM, NSOM) and one accelerated-electron method (TEM, FE-SEM) is required.",
author = "Grabar, {Katherine C.} and Brown, {Kenneth R.} and Keating, {Christine Dolan} and Stranick, {Stephan J.} and Tang, {Sau Lan} and Natan, {Michael J.}",
year = "1997",
month = "1",
day = "1",
doi = "10.1021/ac9605962",
language = "English (US)",
volume = "69",
pages = "471--477",
journal = "Analytical Chemistry",
issn = "0003-2700",
publisher = "American Chemical Society",
number = "3",

}

Nanoscale Characterization of Gold Colloid Monolayers : A Comparison of Four Techniques. / Grabar, Katherine C.; Brown, Kenneth R.; Keating, Christine Dolan; Stranick, Stephan J.; Tang, Sau Lan; Natan, Michael J.

In: Analytical Chemistry, Vol. 69, No. 3, 01.01.1997, p. 471-477.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Nanoscale Characterization of Gold Colloid Monolayers

T2 - A Comparison of Four Techniques

AU - Grabar, Katherine C.

AU - Brown, Kenneth R.

AU - Keating, Christine Dolan

AU - Stranick, Stephan J.

AU - Tang, Sau Lan

AU - Natan, Michael J.

PY - 1997/1/1

Y1 - 1997/1/1

N2 - Atomic force microscopy (AFM), field emission scanning electron microscopy (FE-SEM), transmission electron microscopy (TEM), and near-field scanning optical microscopy (NSOM) have been used to characterize the nanostructure of Au colloid-based surfaces. Because these substrates are composed of particles whose dimensions are known prior to assembly, they are well-suited for a critical comparison of the capabilities and limitations of each nanoscale imaging technique. The three criteria for this comparison, which are relevant to the field of nanoparticle assemblies in general, are (i) accuracy in establishing particle size, particle coverage, and interparticle spacing; (ii) accuracy in delineating surface topography; and (iii) ease of sample preparation, data acquisition, and image analysis. For colloidal Au arrays, TEM gives the most reliable size and spacing information but exhibits the greatest constraints with regard to sample preparation; in contrast, AFM is widely applicable but yields data that are the least straightforward to interpret For accurate information regarding nanometer-scale architecture of particle-based surfaces, a combination of at least one scanning probe method (AFM, NSOM) and one accelerated-electron method (TEM, FE-SEM) is required.

AB - Atomic force microscopy (AFM), field emission scanning electron microscopy (FE-SEM), transmission electron microscopy (TEM), and near-field scanning optical microscopy (NSOM) have been used to characterize the nanostructure of Au colloid-based surfaces. Because these substrates are composed of particles whose dimensions are known prior to assembly, they are well-suited for a critical comparison of the capabilities and limitations of each nanoscale imaging technique. The three criteria for this comparison, which are relevant to the field of nanoparticle assemblies in general, are (i) accuracy in establishing particle size, particle coverage, and interparticle spacing; (ii) accuracy in delineating surface topography; and (iii) ease of sample preparation, data acquisition, and image analysis. For colloidal Au arrays, TEM gives the most reliable size and spacing information but exhibits the greatest constraints with regard to sample preparation; in contrast, AFM is widely applicable but yields data that are the least straightforward to interpret For accurate information regarding nanometer-scale architecture of particle-based surfaces, a combination of at least one scanning probe method (AFM, NSOM) and one accelerated-electron method (TEM, FE-SEM) is required.

UR - http://www.scopus.com/inward/record.url?scp=0031078869&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0031078869&partnerID=8YFLogxK

U2 - 10.1021/ac9605962

DO - 10.1021/ac9605962

M3 - Article

VL - 69

SP - 471

EP - 477

JO - Analytical Chemistry

JF - Analytical Chemistry

SN - 0003-2700

IS - 3

ER -