Natural focusing of x rays from ferroelectric lithium niobate wafers

Stephen Durbin, Terrence Jach, Sungwon Kim, Venkatraman Gopalan

Research output: Contribution to journalArticle

Abstract

The interaction of waves with inhomogeneous media leads to the natural focusing of light, the channelling of waves into stable caustics. We have extended natural focusing to x rays, observing caustics in topographs of ferroelectric lithium niobate. Voltage across domains of reversed polarity induces perturbations to the local crystal planes, producing dramatic variations in the images. Ray tracing shows a "catastrophic" discontinuity, causing bright focal lines. Analysis reveals details of boundary strains and local ferroelectric properties. Controlled focusing could be extended to designed domain patterns to probe microstructural properties, and also to a type of voltage-controlled ferroelectric optics for x rays.

Original languageEnglish (US)
Article number142909
JournalApplied Physics Letters
Volume91
Issue number14
DOIs
StatePublished - Oct 11 2007

Fingerprint

lithium niobates
wafers
alkalies
x rays
electric potential
ray tracing
polarity
discontinuity
optics
perturbation
probes
crystals
interactions

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Cite this

Durbin, Stephen ; Jach, Terrence ; Kim, Sungwon ; Gopalan, Venkatraman. / Natural focusing of x rays from ferroelectric lithium niobate wafers. In: Applied Physics Letters. 2007 ; Vol. 91, No. 14.
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Natural focusing of x rays from ferroelectric lithium niobate wafers. / Durbin, Stephen; Jach, Terrence; Kim, Sungwon; Gopalan, Venkatraman.

In: Applied Physics Letters, Vol. 91, No. 14, 142909, 11.10.2007.

Research output: Contribution to journalArticle

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