New quality metrics for digital image resizing

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Digital image rescaling by interpolation has been intensively researched over past decades, and still getting constant attention from many applications such as medical diagnosis, super-resolution, image blow-up, nano-manufacturing, etc. However, there are no consented metrics to objectively assess and compare the quality of resized images. Some existing measures such as peak-signal-to-noise ratio (PSNR) or mean-squared error (MSE), widely used in image restoration area, do not always coincide with the opinions from viewers. Enlarged digital images generally suffer from two major artifacts: blurring, zigzagging, and those undesirable effects especially around edges significantly degrade the overall perceptual image quality. We propose two new image quality metrics to measure the degree of the two major defects, and compare several existing interpolation methods using the proposed metrics. We also evaluate the validity of image quality metrics by comparing rank correlations.

Original languageEnglish (US)
Title of host publicationApplications of Digital Image Processing XXX
DOIs
StatePublished - Dec 1 2007
EventApplications of Digital Image Processing XXX - San Diego, CA, United States
Duration: Aug 28 2007Aug 30 2007

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6696
ISSN (Print)0277-786X

Other

OtherApplications of Digital Image Processing XXX
CountryUnited States
CitySan Diego, CA
Period8/28/078/30/07

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Kim, H., & Tirupatikumara, S. R. (2007). New quality metrics for digital image resizing. In Applications of Digital Image Processing XXX [669608] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 6696). https://doi.org/10.1117/12.735400