Nominal model for structure-property relations of chiral dielectric sculptured thin films

J. A. Sherwin, Akhlesh Lakhtakia

Research output: Contribution to journalArticle

25 Citations (Scopus)

Abstract

The Bruggeman formalism is implemented to estimate the permittivity dyadics of chiral dielectric sculptured thin films (STFs), called thin-film helicoidal bianisotropic mediums (TFHBMs), modelled as helicoidally arranged stacks of ellipsoidal inclusions in vacuum. Spectral maximums of several observable optical properties of axially excited TFHBM slabs are examined as functions of inclusion shape, volume fraction and orientation. Changes in the transverse aspect ratio of the ellipsoidal inclusions significantly affect the predicted optical properties of the TFHBM. A critical value for the transverse aspect ratio of the ellipsoids can be found such that optical activity disappears when all other parameters are fixed. The orientation of the inclusions significantly affects the value of optical property maximums, and can be made to suppress optical activity completely. A distribution of orientations decreases various measures of optical activity.

Original languageEnglish (US)
Pages (from-to)1499-1514
Number of pages16
JournalMathematical and Computer Modelling
Volume34
Issue number12-13
DOIs
StatePublished - Nov 5 2001

Fingerprint

Dielectric films
Optical Activity
Categorical or nominal
Thin Films
Inclusion
Optical Properties
Thin films
Optical properties
Aspect Ratio
Aspect ratio
Transverse
Permittivity
Ellipsoid
Volume Fraction
Model
Critical value
Volume fraction
Vacuum
Decrease
Estimate

All Science Journal Classification (ASJC) codes

  • Modeling and Simulation
  • Computer Science Applications

Cite this

@article{3c32004547734c8a98be4ff0cdae950b,
title = "Nominal model for structure-property relations of chiral dielectric sculptured thin films",
abstract = "The Bruggeman formalism is implemented to estimate the permittivity dyadics of chiral dielectric sculptured thin films (STFs), called thin-film helicoidal bianisotropic mediums (TFHBMs), modelled as helicoidally arranged stacks of ellipsoidal inclusions in vacuum. Spectral maximums of several observable optical properties of axially excited TFHBM slabs are examined as functions of inclusion shape, volume fraction and orientation. Changes in the transverse aspect ratio of the ellipsoidal inclusions significantly affect the predicted optical properties of the TFHBM. A critical value for the transverse aspect ratio of the ellipsoids can be found such that optical activity disappears when all other parameters are fixed. The orientation of the inclusions significantly affects the value of optical property maximums, and can be made to suppress optical activity completely. A distribution of orientations decreases various measures of optical activity.",
author = "Sherwin, {J. A.} and Akhlesh Lakhtakia",
year = "2001",
month = "11",
day = "5",
doi = "10.1016/S0895-7177(01)00142-X",
language = "English (US)",
volume = "34",
pages = "1499--1514",
journal = "Mathematical and Computer Modelling",
issn = "0895-7177",
publisher = "Elsevier Limited",
number = "12-13",

}

Nominal model for structure-property relations of chiral dielectric sculptured thin films. / Sherwin, J. A.; Lakhtakia, Akhlesh.

In: Mathematical and Computer Modelling, Vol. 34, No. 12-13, 05.11.2001, p. 1499-1514.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Nominal model for structure-property relations of chiral dielectric sculptured thin films

AU - Sherwin, J. A.

AU - Lakhtakia, Akhlesh

PY - 2001/11/5

Y1 - 2001/11/5

N2 - The Bruggeman formalism is implemented to estimate the permittivity dyadics of chiral dielectric sculptured thin films (STFs), called thin-film helicoidal bianisotropic mediums (TFHBMs), modelled as helicoidally arranged stacks of ellipsoidal inclusions in vacuum. Spectral maximums of several observable optical properties of axially excited TFHBM slabs are examined as functions of inclusion shape, volume fraction and orientation. Changes in the transverse aspect ratio of the ellipsoidal inclusions significantly affect the predicted optical properties of the TFHBM. A critical value for the transverse aspect ratio of the ellipsoids can be found such that optical activity disappears when all other parameters are fixed. The orientation of the inclusions significantly affects the value of optical property maximums, and can be made to suppress optical activity completely. A distribution of orientations decreases various measures of optical activity.

AB - The Bruggeman formalism is implemented to estimate the permittivity dyadics of chiral dielectric sculptured thin films (STFs), called thin-film helicoidal bianisotropic mediums (TFHBMs), modelled as helicoidally arranged stacks of ellipsoidal inclusions in vacuum. Spectral maximums of several observable optical properties of axially excited TFHBM slabs are examined as functions of inclusion shape, volume fraction and orientation. Changes in the transverse aspect ratio of the ellipsoidal inclusions significantly affect the predicted optical properties of the TFHBM. A critical value for the transverse aspect ratio of the ellipsoids can be found such that optical activity disappears when all other parameters are fixed. The orientation of the inclusions significantly affects the value of optical property maximums, and can be made to suppress optical activity completely. A distribution of orientations decreases various measures of optical activity.

UR - http://www.scopus.com/inward/record.url?scp=0035813980&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0035813980&partnerID=8YFLogxK

U2 - 10.1016/S0895-7177(01)00142-X

DO - 10.1016/S0895-7177(01)00142-X

M3 - Article

AN - SCOPUS:0035813980

VL - 34

SP - 1499

EP - 1514

JO - Mathematical and Computer Modelling

JF - Mathematical and Computer Modelling

SN - 0895-7177

IS - 12-13

ER -