Non-axial-scanning second harmonic microscopy

Chuan Yang, Kebin Shi, Haifeng Li, Qian Xu, Venkatraman Gopalan, Zhiwen Liu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We demonstrate a chromatic second harmonic imaging technique that exploits the chromatic aberration of a Fresnel lens to focus different wavelengths into different axial positions to effectively realize axial scanning and improve imaging speed.

Original languageEnglish (US)
Title of host publicationQuantum Electronics and Laser Science Conference, QELS 2011
StatePublished - Dec 1 2011
EventQuantum Electronics and Laser Science Conference, QELS 2011 - Baltimore, MD, United States
Duration: May 1 2011May 6 2011

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherQuantum Electronics and Laser Science Conference, QELS 2011
CountryUnited States
CityBaltimore, MD
Period5/1/115/6/11

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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  • Cite this

    Yang, C., Shi, K., Li, H., Xu, Q., Gopalan, V., & Liu, Z. (2011). Non-axial-scanning second harmonic microscopy. In Quantum Electronics and Laser Science Conference, QELS 2011 (Optics InfoBase Conference Papers).