Non-axial-scanning second harmonic microscopy

Chuan Yang, Kebin Shi, Haifeng Li, Qian Xu, Venkatraman Gopalan, Zhiwen Liu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We demonstrate a chromatic second harmonic imaging technique that exploits the chromatic aberration of a Fresnel lens to focus different wavelengths into different axial positions to effectively realize axial scanning and improve imaging speed.

Original languageEnglish (US)
Title of host publication2011 Conference on Lasers and Electro-Optics
Subtitle of host publicationLaser Science to Photonic Applications, CLEO 2011
StatePublished - Sep 1 2011
Event2011 Conference on Lasers and Electro-Optics, CLEO 2011 - Baltimore, MD, United States
Duration: May 1 2011May 6 2011

Publication series

Name2011 Conference on Lasers and Electro-Optics: Laser Science to Photonic Applications, CLEO 2011

Other

Other2011 Conference on Lasers and Electro-Optics, CLEO 2011
CountryUnited States
CityBaltimore, MD
Period5/1/115/6/11

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics

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  • Cite this

    Yang, C., Shi, K., Li, H., Xu, Q., Gopalan, V., & Liu, Z. (2011). Non-axial-scanning second harmonic microscopy. In 2011 Conference on Lasers and Electro-Optics: Laser Science to Photonic Applications, CLEO 2011 [5950961] (2011 Conference on Lasers and Electro-Optics: Laser Science to Photonic Applications, CLEO 2011).