Non-destructive evaluation and flaw visualization using an eddy current probe

Rafic A. Bachnak, Scott King

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

This paper describes the development of an eddy current prototype that combines positional and eddycurrent data to produce a C-scan of tested material. The preliminary system consists of an eddy current probe, a position tracking mechanism, and basic data visualization capability. Test results of the prototype are presented and briefly discussed.

Original languageEnglish (US)
Title of host publication3rd International Conference on Systems, ICONS 2008
Pages134-139
Number of pages6
DOIs
Publication statusPublished - Sep 5 2008
Event3rd International Conference on Systems, ICONS 2008 - Cancun, Mexico
Duration: Apr 13 2008Apr 18 2008

Publication series

Name3rd International Conference on Systems, ICONS 2008

Other

Other3rd International Conference on Systems, ICONS 2008
CountryMexico
CityCancun
Period4/13/084/18/08

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All Science Journal Classification (ASJC) codes

  • Computational Theory and Mathematics
  • Hardware and Architecture
  • Electrical and Electronic Engineering

Cite this

Bachnak, R. A., & King, S. (2008). Non-destructive evaluation and flaw visualization using an eddy current probe. In 3rd International Conference on Systems, ICONS 2008 (pp. 134-139). [4497111] (3rd International Conference on Systems, ICONS 2008). https://doi.org/10.1109/ICONS.2008.61