Non-uniform space charge controlled KTN beam deflector

Ju Hung Chao, Wenbin Zhu, Chang Jiang Chen, Stuart Yin, Robert C. Hoffman

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Scopus citations

    Abstract

    A non-uniform space charge-controlled KTN beam deflector is presented and analyzed. We found that a non-uniform space charge can result in a non-uniform beam deflection angles. This effect can be useful for some applications such as electric field controlled beam separation. However, a non-uniform space charge needs to be avoided if one wants uniform beam deflection throughout the entire crystal.

    Original languageEnglish (US)
    Title of host publicationPhotonic Fiber and Crystal Devices
    Subtitle of host publicationAdvances in Materials and Innovations in Device Applications X
    EditorsRuyan Guo, Shizhuo Yin
    PublisherSPIE
    ISBN (Electronic)9781510603073
    DOIs
    StatePublished - Jan 1 2016
    EventPhotonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications X - San Diego, United States
    Duration: Aug 28 2016Aug 29 2016

    Publication series

    NameProceedings of SPIE - The International Society for Optical Engineering
    Volume9958
    ISSN (Print)0277-786X
    ISSN (Electronic)1996-756X

    Other

    OtherPhotonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications X
    CountryUnited States
    CitySan Diego
    Period8/28/168/29/16

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    All Science Journal Classification (ASJC) codes

    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics
    • Computer Science Applications
    • Applied Mathematics
    • Electrical and Electronic Engineering

    Cite this

    Chao, J. H., Zhu, W., Chen, C. J., Yin, S., & Hoffman, R. C. (2016). Non-uniform space charge controlled KTN beam deflector. In R. Guo, & S. Yin (Eds.), Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications X [99580S] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9958). SPIE. https://doi.org/10.1117/12.2239961