TY - GEN
T1 - Nonvolatile processors
T2 - 20th Design, Automation and Test in Europe, DATE 2017
AU - Su, Fang
AU - Ma, Kaisheng
AU - Li, Xueqing
AU - Wu, Tongda
AU - Liu, Yongpan
AU - Narayanan, Vijaykrishnan
PY - 2017/5/11
Y1 - 2017/5/11
N2 - Energy harvesting has become a promising solution to power up Internet-of-Things (IoT) devices. In this scenario, the constrained power budget and frequent absence of ambient energy cause severe reliability issues and performance degradation on conventional CMOS computing circuits. Fortunately, the advent of nonvolatile processor (NVP) opens the possibility to compute continuously using an intermittent power supply. It is considered as a key component of the next generation IoT edge devices. In this work, we provide insights to the evolution of the NVP and its application in real world scenarios. Efforts on improving the performance of NVP and future research prospects are also discussed in this paper.
AB - Energy harvesting has become a promising solution to power up Internet-of-Things (IoT) devices. In this scenario, the constrained power budget and frequent absence of ambient energy cause severe reliability issues and performance degradation on conventional CMOS computing circuits. Fortunately, the advent of nonvolatile processor (NVP) opens the possibility to compute continuously using an intermittent power supply. It is considered as a key component of the next generation IoT edge devices. In this work, we provide insights to the evolution of the NVP and its application in real world scenarios. Efforts on improving the performance of NVP and future research prospects are also discussed in this paper.
UR - http://www.scopus.com/inward/record.url?scp=85020214662&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85020214662&partnerID=8YFLogxK
U2 - 10.23919/DATE.2017.7927131
DO - 10.23919/DATE.2017.7927131
M3 - Conference contribution
AN - SCOPUS:85020214662
T3 - Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017
SP - 966
EP - 971
BT - Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 27 March 2017 through 31 March 2017
ER -