Novel application of spintronics in computing, sensing, storage and cybersecurity

Seyedhamidreza Motaman, Mohammad Nasim Imtiaz Khan, Swaroop Ghosh

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

With conventional Von Neumann computing struggling to match the energy-efficiency of biological systems, there is pressing need to explore alternative computing models. CMOS switches, although universal, fails to offer additional features to meet this end goal Recent experimental studies have revealed that spintronics possess many promising features that can not only enable non Von Neumann compute models but also high-density storage, sensing of environmental parameters and protection from cybersecurity threats. This paper provides an in-depth study of spintronics and its relation to these novel aspects from device, circuit and system standpoint.

Original languageEnglish (US)
Title of host publicationProceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages125-130
Number of pages6
ISBN (Electronic)9783981926316
DOIs
StatePublished - Apr 19 2018
Event2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018 - Dresden, Germany
Duration: Mar 19 2018Mar 23 2018

Publication series

NameProceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018
Volume2018-January

Other

Other2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018
CountryGermany
CityDresden
Period3/19/183/23/18

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All Science Journal Classification (ASJC) codes

  • Safety, Risk, Reliability and Quality
  • Hardware and Architecture
  • Software
  • Information Systems and Management

Cite this

Motaman, S., Khan, M. N. I., & Ghosh, S. (2018). Novel application of spintronics in computing, sensing, storage and cybersecurity. In Proceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018 (pp. 125-130). (Proceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018; Vol. 2018-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.23919/DATE.2018.8341991