Novel magnetic burn-in for retention testing of STTRAM

Mohammad Nasim Imtiaz Khan, Anirudh S. Iyengar, Swaroop Ghosh

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    6 Scopus citations

    Abstract

    Spin-Transfer Torque RAM (STTRAM) is an emerging Non-Volatile Memory (NVM) technology that has drawn significant attention due to complete elimination of bitcell leakage. However, it brings new challenges in characterizing the retention time of the array during test. Significant shift of retention time under static (process variation (PV)) and dynamic (voltage, temperature fluctuation) variability furthers this issue. In this paper, we propose a novel magnetic burn-in (MBI) test which can be implemented with minimal changes in the existing test flow to enable STTRAM retention testing at short test time. The magnetic burn-in is also combined with thermal burn-in (MBI-BI) for further compression of retention and test time. Simulation results indicate MBI with 220Oe (at 25C) can improve the test time by 3.71×1013 X while MBI-BI with 220Oe at 125C can improve the test time by 1.97×1014X.

    Original languageEnglish (US)
    Title of host publicationProceedings of the 2017 Design, Automation and Test in Europe, DATE 2017
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages666-669
    Number of pages4
    ISBN (Electronic)9783981537093
    DOIs
    StatePublished - May 11 2017
    Event20th Design, Automation and Test in Europe, DATE 2017 - Swisstech, Lausanne, Switzerland
    Duration: Mar 27 2017Mar 31 2017

    Publication series

    NameProceedings of the 2017 Design, Automation and Test in Europe, DATE 2017

    Other

    Other20th Design, Automation and Test in Europe, DATE 2017
    CountrySwitzerland
    CitySwisstech, Lausanne
    Period3/27/173/31/17

    All Science Journal Classification (ASJC) codes

    • Computer Networks and Communications
    • Hardware and Architecture
    • Safety, Risk, Reliability and Quality

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  • Cite this

    Khan, M. N. I., Iyengar, A. S., & Ghosh, S. (2017). Novel magnetic burn-in for retention testing of STTRAM. In Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017 (pp. 666-669). [7927073] (Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.23919/DATE.2017.7927073