NTIRE 2017 Challenge on Single Image Super-Resolution: Methods and Results

Radu Timofte, Eirikur Agustsson, Luc Van Gool, Ming Hsuan Yang, Lei Zhang, Bee Lim, Sanghyun Son, Heewon Kim, Seungjun Nah, Kyoung Mu Lee, Xintao Wang, Yapeng Tian, Ke Yu, Yulun Zhang, Shixiang Wu, Chao Dong, Liang Lin, Yu Qiao, Chen Change Loy, Woong BaeJaejun Yoo, Yoseob Han, Jong Chul Ye, Jae Seok Choi, Munchurl Kim, Yuchen Fan, Jiahui Yu, Wei Han, Ding Liu, Haichao Yu, Zhangyang Wang, Honghui Shi, Xinchao Wang, Thomas S. Huang, Yunjin Chen, Kai Zhang, Wangmeng Zuo, Zhimin Tang, Linkai Luo, Shaohui Li, Min Fu, Lei Cao, Wen Heng, Giang Bui, Truc Le, Ye Duan, Dacheng Tao, Ruxin Wang, Xu Lin, Jianxin Pang, Jinchang Xu, Yu Zhao, Xiangyu Xu, Jinshan Pan, Deqing Sun, Yujin Zhang, Xibin Song, Yuchao Dai, Xueying Qin, Xuan Phung Huynh, Tiantong Guo, Hojjat Seyed Mousavi, Tiep Huu Vu, Vishal Monga, Cristovao Cruz, Karen Egiazarian, Vladimir Katkovnik, Rakesh Mehta, Arnav Kumar Jain, Abhinav Agarwalla, Ch V.Sai Praveen, Ruofan Zhou, Hongdiao Wen, Che Zhu, Zhiqiang Xia, Zhengtao Wang, Qi Guo

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    478 Scopus citations

    Abstract

    This paper reviews the first challenge on single image super-resolution (restoration of rich details in an low resolution image) with focus on proposed solutions and results. A new DIVerse 2K resolution image dataset (DIV2K) was employed. The challenge had 6 competitions divided into 2 tracks with 3 magnification factors each. Track 1 employed the standard bicubic downscaling setup, while Track 2 had unknown downscaling operators (blur kernel and decimation) but learnable through low and high res train images. Each competition had b∼100 registered participants and 20 teams competed in the final testing phase. They gauge the state-of-the-art in single image super-resolution.

    Original languageEnglish (US)
    Title of host publicationProceedings - 30th IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2017
    PublisherIEEE Computer Society
    Pages1110-1121
    Number of pages12
    ISBN (Electronic)9781538607336
    DOIs
    StatePublished - Aug 22 2017
    Event30th IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2017 - Honolulu, United States
    Duration: Jul 21 2017Jul 26 2017

    Publication series

    NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
    Volume2017-July
    ISSN (Print)2160-7508
    ISSN (Electronic)2160-7516

    Other

    Other30th IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2017
    Country/TerritoryUnited States
    CityHonolulu
    Period7/21/177/26/17

    All Science Journal Classification (ASJC) codes

    • Computer Vision and Pattern Recognition
    • Electrical and Electronic Engineering

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