Observation and mobility study of single 180° domain wall using a near-field scanning optical microscope

T. J. Yang, U. Mohideen, Venkatraman Gopalan, P. Swart

Research output: Contribution to journalArticle

Abstract

We have made a direct and nanometer scale observation of single 180° domain walls in 500 μm thick ferroelectric LiTaO3 by using a collection mode Near-Field Scanning Optical Microscope. We unambiguously identify single domain walls by simultaneously recording nanometer scale topographic and optical images. The polarization rotation of a linear polarized laser beam due to the birefringence at the domain wall is optically imaged with 80-100nm spatial resolution. Next we have made a direct nanometer scale study of the mobility of a single 180° domain wall under a uniform applied electric field using the same technique. The mobility of the domain walls is strongly influenced by sub-surface pinning defects.

Original languageEnglish (US)
Pages (from-to)351-358
Number of pages8
JournalFerroelectrics
Volume222
Issue number1-4
DOIs
StatePublished - Jan 1 1999

Fingerprint

Domain walls
optical microscopes
domain wall
near fields
Microscopes
Scanning
scanning
Birefringence
Ferroelectric materials
Laser beams
birefringence
spatial resolution
recording
Electric fields
laser beams
Polarization
Defects
electric fields
defects
polarization

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

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abstract = "We have made a direct and nanometer scale observation of single 180° domain walls in 500 μm thick ferroelectric LiTaO3 by using a collection mode Near-Field Scanning Optical Microscope. We unambiguously identify single domain walls by simultaneously recording nanometer scale topographic and optical images. The polarization rotation of a linear polarized laser beam due to the birefringence at the domain wall is optically imaged with 80-100nm spatial resolution. Next we have made a direct nanometer scale study of the mobility of a single 180° domain wall under a uniform applied electric field using the same technique. The mobility of the domain walls is strongly influenced by sub-surface pinning defects.",
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Observation and mobility study of single 180° domain wall using a near-field scanning optical microscope. / Yang, T. J.; Mohideen, U.; Gopalan, Venkatraman; Swart, P.

In: Ferroelectrics, Vol. 222, No. 1-4, 01.01.1999, p. 351-358.

Research output: Contribution to journalArticle

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