Observation and mobility study of single 180° domain wall using a near-field scanning optical microscope

T. J. Yang, U. Mohideen, Venkat Gopalan, P. Swart

Research output: Contribution to journalArticlepeer-review

Abstract

We have made a direct and nanometer scale observation of single 180° domain walls in 500 μm thick ferroelectric LiTaO3 by using a collection mode Near-Field Scanning Optical Microscope. We unambiguously identify single domain walls by simultaneously recording nanometer scale topographic and optical images. The polarization rotation of a linear polarized laser beam due to the birefringence at the domain wall is optically imaged with 80-100nm spatial resolution. Next we have made a direct nanometer scale study of the mobility of a single 180° domain wall under a uniform applied electric field using the same technique. The mobility of the domain walls is strongly influenced by sub-surface pinning defects.

Original languageEnglish (US)
Pages (from-to)351-358
Number of pages8
JournalFerroelectrics
Volume222
Issue number1-4
DOIs
StatePublished - Jan 1 1999

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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