Observation of Radiation-Induced Leakage Current Defects in MOS Oxides with Multifrequency Electrically Detected Magnetic Resonance and Near-Zero-Field Magnetoresistance

Stephen J. Moxim, James P. Ashton, Patrick M. Lenahan, Michael E. Flatte, Nicholas J. Harmon, Sean W. King

Research output: Contribution to journalArticlepeer-review

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Engineering & Materials Science

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