Observations of NBTI-induced atomic scale defects

J. P. Campbell, P. M. Lenahan, A. T. Krishnan, S. Krishnan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Fingerprint

Dive into the research topics of 'Observations of NBTI-induced atomic scale defects'. Together they form a unique fingerprint.

Engineering & Materials Science