On calibration of a nominal structure-property relationship model for chiral sculptured thin films by axial transmittance measurements

J. A. Sherwin, A. Lakhtakia, I. J. Hodgkinson

Research output: Contribution to journalArticle

48 Citations (Scopus)

Abstract

A chiral sculptured thin film is fabricated from patinal titanium oxide using the serial bideposition technique. Axial transmittance spectrums are measured over a spectral region encompassing the Bragg regime for axial excitation. The same spectrums are calculated using a nominal structure-property relationship model and the parameter space of the model is explored for best fits of the calculated and measured transmittances. Ambiguity arising on calibrating the model against axial transmittance measurements is shown to be resolvable using non-axial transmittance measurements.

Original languageEnglish (US)
Pages (from-to)369-375
Number of pages7
JournalOptics Communications
Volume209
Issue number4-6
DOIs
StatePublished - Aug 15 2002

Fingerprint

transmittance
Calibration
Thin films
thin films
Titanium oxides
calibrating
titanium oxides
ambiguity
excitation
titanium dioxide

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Physical and Theoretical Chemistry
  • Electrical and Electronic Engineering

Cite this

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On calibration of a nominal structure-property relationship model for chiral sculptured thin films by axial transmittance measurements. / Sherwin, J. A.; Lakhtakia, A.; Hodgkinson, I. J.

In: Optics Communications, Vol. 209, No. 4-6, 15.08.2002, p. 369-375.

Research output: Contribution to journalArticle

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AU - Sherwin, J. A.

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