On de-embedding phase for high speed connectors

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

The phase error problem in de-embedding is examined for board structures and devices under test (DUT). The main feature of this paper is the comparison between the Sparameter data for the embedded DUT and the data for a judiciously chosen reference situation. It is important to note that de-embedding the phase is essential in the design of high-speed connectors in consumer electronics hardware, especially in providing "swappable" models for high-end microprocessor-based applications.

Original languageEnglish (US)
Title of host publication2008 Digest of Technical Papers International Conference on Consumer Electronics, The Mobile Consumer, ICCE 2008
DOIs
StatePublished - Sep 23 2008
Event26th IEEE International Conference on Consumer Electronics, The Mobile Consumer, ICCE 2008 - Las Vegas, NV, United States
Duration: Jan 9 2008Jan 13 2008

Publication series

NameDigest of Technical Papers - IEEE International Conference on Consumer Electronics
ISSN (Print)0747-668X

Other

Other26th IEEE International Conference on Consumer Electronics, The Mobile Consumer, ICCE 2008
CountryUnited States
CityLas Vegas, NV
Period1/9/081/13/08

All Science Journal Classification (ASJC) codes

  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

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