On-line condition monitoring of nuclear systems via symbolic time series analysis

Venkatesh Rajagopalan, Asok Ray, Humberto E. Garcia

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

This paper provides a symbolic time series analysis approach to fault diagnostics and condition monitoring. The proposed technique is built upon concepts from wavelet theory, symbolic dynamics and pattern recognition. Various aspects of the methodology such as wavelet selection, choice of alphabet and determination of depth of D-Markov Machine are explained in the paper. The technique is validated with experiments performed in a Machine Condition Monitoring (MCM) test bed at the Idaho National Laboratory.

Original languageEnglish (US)
Title of host publication5th International Topical Meeting on Nuclear Plant Instrumentation Controls, and Human Machine Interface Technology (NPIC and HMIT 2006)
Pages323-330
Number of pages8
StatePublished - Dec 1 2006
Event5th International Topical Meeting on Nuclear Plant Instrumentation Controls, and Human Machine Interface Technology (NPIC and HMIT 2006) - Albuquerque, NM, United States
Duration: Nov 12 2006Nov 16 2006

Publication series

Name5th International Topical Meeting on Nuclear Plant Instrumentation Controls, and Human Machine Interface Technology (NPIC and HMIT 2006)
Volume2006

Other

Other5th International Topical Meeting on Nuclear Plant Instrumentation Controls, and Human Machine Interface Technology (NPIC and HMIT 2006)
CountryUnited States
CityAlbuquerque, NM
Period11/12/0611/16/06

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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    Rajagopalan, V., Ray, A., & Garcia, H. E. (2006). On-line condition monitoring of nuclear systems via symbolic time series analysis. In 5th International Topical Meeting on Nuclear Plant Instrumentation Controls, and Human Machine Interface Technology (NPIC and HMIT 2006) (pp. 323-330). (5th International Topical Meeting on Nuclear Plant Instrumentation Controls, and Human Machine Interface Technology (NPIC and HMIT 2006); Vol. 2006).