Ontology-based malfunction forecast and root cause analysis in product design

Xiaomeng Chang, Janis Terpenny

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

In product design, passing undetected errors to the downstream can cause error avalanche, could diminish product acceptance and largely increase the overall cost. Yet, it is difficult for designers to collect all the related potential errors from different departments in the initial design phase. In order to deal with these problems, this paper puts forward an ontology based method to integrate related history error data from different data sources of multiple departments in an enterprise. By using the advantages of ontologies and ontology-based information systems in knowledge management and semantic reasoning, the method enables the investigation of the root cause of the related potential malfunctions in the early product design phase. The framework can provide warnings and root causes of related potential errors in design based on history data and further continuously improve the product design. In this manner, this method is expected to reduce the knowledge limitation of designers in the initial design phase, help designers consider the problems in the whole enterprise and the product life cycle more completely, facilitate design improvement more accurately and efficiently, and further reduce the cost of the overall product life cycle.

Original languageEnglish (US)
Title of host publicationASME 2012 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, IDETC/CIE 2012
Pages937-945
Number of pages9
EditionPARTS A AND B
DOIs
StatePublished - Dec 1 2012
EventASME 2012 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, IDETC/CIE 2012 - Chicago, IL, United States
Duration: Aug 12 2012Aug 12 2012

Publication series

NameProceedings of the ASME Design Engineering Technical Conference
NumberPARTS A AND B
Volume2

Other

OtherASME 2012 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, IDETC/CIE 2012
CountryUnited States
CityChicago, IL
Period8/12/128/12/12

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All Science Journal Classification (ASJC) codes

  • Modeling and Simulation
  • Mechanical Engineering
  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design

Cite this

Chang, X., & Terpenny, J. (2012). Ontology-based malfunction forecast and root cause analysis in product design. In ASME 2012 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, IDETC/CIE 2012 (PARTS A AND B ed., pp. 937-945). (Proceedings of the ASME Design Engineering Technical Conference; Vol. 2, No. PARTS A AND B). https://doi.org/10.1115/DETC2012-70754