This paper proposes a variation of the optimum accelerated lifetest plans described by Nelson and others, and shows how to minimize the maximum test-stress that is required, subject to meeting a certain standard-deviation limit on the estimate. Previous optimal lifetest plans have shown how to minimize the standard-deviation of the estimated product life, subject to a given maximum test-stress. Reader Aids - Purpose: Tutorial Special math needed for explanations: Elementary statistics and optimization Special math needed for results: None Results useful to: Reliability analysts.
All Science Journal Classification (ASJC) codes
- Safety, Risk, Reliability and Quality
- Electrical and Electronic Engineering