TY - JOUR
T1 - Optimization of the Growth of the Van der Waals Materials Bi2Se3and (Bi0.5In0.5)2Se3by Molecular Beam Epitaxy
AU - Wang, Zhengtianye
AU - Law, Stephanie
N1 - Funding Information:
This project is supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Award DE-SC0017801.
Publisher Copyright:
© 2021 American Chemical Society.
PY - 2021/12/1
Y1 - 2021/12/1
N2 - The naturally existing chalcogenide Bi2Se3 is topologically nontrivial due to the band inversion caused by the strong spin-orbit coupling inside the bulk of the material. The surface states are spin polarized, protected by the time-inversion symmetry, and thus robust to the scattering caused by nonmagnetic defects. A high-purity topological insulator thin film can be easily grown via molecular beam epitaxy (MBE) on various substrates to enable novel electronics, optics, and spintronics applications. However, the unique surface state properties have historically been limited by the film quality, which is evaluated by crystallinity, surface morphology, and transport data. Here we propose and investigate different MBE growth strategies to improve the quality of Bi2Se3 thin films grown by MBE. Based on the surface passivation status, we have classified the substrates into two categories, self-passivated or unpassivated, and determine the optimal growth mechanisms on the representative sapphire and GaAs, respectively. For Bi2Se3 on GaAs, the surface passivation status determines the dominant growth mechanism. In the end, growths of the topological trivial insulator (Bi0.5In0.5)2Se3 (BIS) on GaAs are investigated following the protocols proposed.
AB - The naturally existing chalcogenide Bi2Se3 is topologically nontrivial due to the band inversion caused by the strong spin-orbit coupling inside the bulk of the material. The surface states are spin polarized, protected by the time-inversion symmetry, and thus robust to the scattering caused by nonmagnetic defects. A high-purity topological insulator thin film can be easily grown via molecular beam epitaxy (MBE) on various substrates to enable novel electronics, optics, and spintronics applications. However, the unique surface state properties have historically been limited by the film quality, which is evaluated by crystallinity, surface morphology, and transport data. Here we propose and investigate different MBE growth strategies to improve the quality of Bi2Se3 thin films grown by MBE. Based on the surface passivation status, we have classified the substrates into two categories, self-passivated or unpassivated, and determine the optimal growth mechanisms on the representative sapphire and GaAs, respectively. For Bi2Se3 on GaAs, the surface passivation status determines the dominant growth mechanism. In the end, growths of the topological trivial insulator (Bi0.5In0.5)2Se3 (BIS) on GaAs are investigated following the protocols proposed.
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U2 - 10.1021/acs.cgd.1c00663
DO - 10.1021/acs.cgd.1c00663
M3 - Article
AN - SCOPUS:85118866177
SN - 1528-7483
VL - 21
SP - 6752
EP - 6765
JO - Crystal Growth and Design
JF - Crystal Growth and Design
IS - 12
ER -