Optimizing direct magnetoelectric coupling in Pb(Zr,Ti)O3/Ni multiferroic film heterostructures

Ming Feng, Jian Jun Wang, Jia Mian Hu, Jing Wang, Jing Ma, Hai Bo Li, Yang Shen, Yuan Hua Lin, Long Qing Chen, Ce Wen Nan

Research output: Contribution to journalArticle

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Abstract

Polycrystalline Pt thin films of different thicknesses (0-75 nm) were introduced using magnetron sputtering in Pb(Zr0.52Ti0.48)O3 (PZT, 400 nm in thickness)/Pt/Ni multiferroic film heterostructures, aimed at optimizing the transfer efficiency of magnetostrictive strain from the bottom Ni foil to the top PZT film and thus the direct magnetoelectric (ME) coupling. The ME voltage coefficient αE31 was directly measured, while the strain transfer efficiency k was obtained by combined experimental and theoretical analysis. At the optimum Pt-thickness of 30 nm, the polycrystalline film heterostructure shows the largest αE31 of 772 mV cm-1 Oe-1 at a low dc magnetic bias field of 86 Oe, as well as the highest k of 83% that is comparable to that in epitaxial quasi-2-2 film heterostructures.

Original languageEnglish (US)
Article number072901
JournalApplied Physics Letters
Volume106
Issue number7
DOIs
StatePublished - Feb 16 2015

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foils
magnetron sputtering
electric potential
coefficients
thin films

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Cite this

Feng, Ming ; Wang, Jian Jun ; Hu, Jia Mian ; Wang, Jing ; Ma, Jing ; Li, Hai Bo ; Shen, Yang ; Lin, Yuan Hua ; Chen, Long Qing ; Nan, Ce Wen. / Optimizing direct magnetoelectric coupling in Pb(Zr,Ti)O3/Ni multiferroic film heterostructures. In: Applied Physics Letters. 2015 ; Vol. 106, No. 7.
@article{5c970ccaa4404c2099c9f28012db6749,
title = "Optimizing direct magnetoelectric coupling in Pb(Zr,Ti)O3/Ni multiferroic film heterostructures",
abstract = "Polycrystalline Pt thin films of different thicknesses (0-75 nm) were introduced using magnetron sputtering in Pb(Zr0.52Ti0.48)O3 (PZT, 400 nm in thickness)/Pt/Ni multiferroic film heterostructures, aimed at optimizing the transfer efficiency of magnetostrictive strain from the bottom Ni foil to the top PZT film and thus the direct magnetoelectric (ME) coupling. The ME voltage coefficient αE31 was directly measured, while the strain transfer efficiency k was obtained by combined experimental and theoretical analysis. At the optimum Pt-thickness of 30 nm, the polycrystalline film heterostructure shows the largest αE31 of 772 mV cm-1 Oe-1 at a low dc magnetic bias field of 86 Oe, as well as the highest k of 83{\%} that is comparable to that in epitaxial quasi-2-2 film heterostructures.",
author = "Ming Feng and Wang, {Jian Jun} and Hu, {Jia Mian} and Jing Wang and Jing Ma and Li, {Hai Bo} and Yang Shen and Lin, {Yuan Hua} and Chen, {Long Qing} and Nan, {Ce Wen}",
year = "2015",
month = "2",
day = "16",
doi = "10.1063/1.4913471",
language = "English (US)",
volume = "106",
journal = "Applied Physics Letters",
issn = "0003-6951",
publisher = "American Institute of Physics Publising LLC",
number = "7",

}

Optimizing direct magnetoelectric coupling in Pb(Zr,Ti)O3/Ni multiferroic film heterostructures. / Feng, Ming; Wang, Jian Jun; Hu, Jia Mian; Wang, Jing; Ma, Jing; Li, Hai Bo; Shen, Yang; Lin, Yuan Hua; Chen, Long Qing; Nan, Ce Wen.

In: Applied Physics Letters, Vol. 106, No. 7, 072901, 16.02.2015.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Optimizing direct magnetoelectric coupling in Pb(Zr,Ti)O3/Ni multiferroic film heterostructures

AU - Feng, Ming

AU - Wang, Jian Jun

AU - Hu, Jia Mian

AU - Wang, Jing

AU - Ma, Jing

AU - Li, Hai Bo

AU - Shen, Yang

AU - Lin, Yuan Hua

AU - Chen, Long Qing

AU - Nan, Ce Wen

PY - 2015/2/16

Y1 - 2015/2/16

N2 - Polycrystalline Pt thin films of different thicknesses (0-75 nm) were introduced using magnetron sputtering in Pb(Zr0.52Ti0.48)O3 (PZT, 400 nm in thickness)/Pt/Ni multiferroic film heterostructures, aimed at optimizing the transfer efficiency of magnetostrictive strain from the bottom Ni foil to the top PZT film and thus the direct magnetoelectric (ME) coupling. The ME voltage coefficient αE31 was directly measured, while the strain transfer efficiency k was obtained by combined experimental and theoretical analysis. At the optimum Pt-thickness of 30 nm, the polycrystalline film heterostructure shows the largest αE31 of 772 mV cm-1 Oe-1 at a low dc magnetic bias field of 86 Oe, as well as the highest k of 83% that is comparable to that in epitaxial quasi-2-2 film heterostructures.

AB - Polycrystalline Pt thin films of different thicknesses (0-75 nm) were introduced using magnetron sputtering in Pb(Zr0.52Ti0.48)O3 (PZT, 400 nm in thickness)/Pt/Ni multiferroic film heterostructures, aimed at optimizing the transfer efficiency of magnetostrictive strain from the bottom Ni foil to the top PZT film and thus the direct magnetoelectric (ME) coupling. The ME voltage coefficient αE31 was directly measured, while the strain transfer efficiency k was obtained by combined experimental and theoretical analysis. At the optimum Pt-thickness of 30 nm, the polycrystalline film heterostructure shows the largest αE31 of 772 mV cm-1 Oe-1 at a low dc magnetic bias field of 86 Oe, as well as the highest k of 83% that is comparable to that in epitaxial quasi-2-2 film heterostructures.

UR - http://www.scopus.com/inward/record.url?scp=84923333504&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84923333504&partnerID=8YFLogxK

U2 - 10.1063/1.4913471

DO - 10.1063/1.4913471

M3 - Article

AN - SCOPUS:84923333504

VL - 106

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

IS - 7

M1 - 072901

ER -