Organic geochemical microanalysis by time-of-flight secondary ion mass spectrometry (ToF-SIMS)

Peter Sjövall, Volker Thiel, Sandra Siljeström, Christine Marcelle Heim, Tomas Hode, Jukka Lausmaa

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a powerful method for the chemical analysis of solid surfaces. In this paper, the capabilities and limitations of this technique and the potential for its use in geochemical research are outlined. Using ToF-SIMS, the chemical composition of sample structures down to 10-100 μm can be determined, without the need for pre-selection or labelling of the analysed substances. In addition, the lateral distribution of organic and inorganic compounds can be mapped in geochemical samples at a resolution in the micrometre range. The capabilities of the technique in geochemistry are illustrated by two examples. In the first example, it is shown that ToF-SIMS can be used to detect biomarkers in oil samples, making it a promising method for the analysis of biomarkers in fluid inclusions. In the second example, a number of specific lipid biomarkers were identified and mapped on the surface of a microbial mat cryosection surface. Post-measurement optical microscopy correlated the localisation of the lipids with the presence of methanotrophic archaea in the microbial mat.

Original languageEnglish (US)
Pages (from-to)267-277
Number of pages11
JournalGeostandards and Geoanalytical Research
Volume32
Issue number3
DOIs
StatePublished - Oct 10 2008

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Microanalysis
Biomarkers
Secondary ion mass spectrometry
biomarker
microbial mat
mass spectrometry
ion
lipid
Lipids
Inorganic compounds
inorganic compound
Geochemistry
Chemical analysis
Organic compounds
chemical analysis
Labeling
fluid inclusion
Optical microscopy
microscopy
organic compound

All Science Journal Classification (ASJC) codes

  • Geology
  • Geochemistry and Petrology

Cite this

Sjövall, Peter ; Thiel, Volker ; Siljeström, Sandra ; Heim, Christine Marcelle ; Hode, Tomas ; Lausmaa, Jukka. / Organic geochemical microanalysis by time-of-flight secondary ion mass spectrometry (ToF-SIMS). In: Geostandards and Geoanalytical Research. 2008 ; Vol. 32, No. 3. pp. 267-277.
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Organic geochemical microanalysis by time-of-flight secondary ion mass spectrometry (ToF-SIMS). / Sjövall, Peter; Thiel, Volker; Siljeström, Sandra; Heim, Christine Marcelle; Hode, Tomas; Lausmaa, Jukka.

In: Geostandards and Geoanalytical Research, Vol. 32, No. 3, 10.10.2008, p. 267-277.

Research output: Contribution to journalArticle

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