Origin of preferential orthorhombic twinning in SrRuO3 epitaxial thin films

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Abstract

In order to elucidate the driving forces which promote oriented in-plane crystallographic texture in SrRuO3 thin films deposited on stepped SrTiO3 substrates, a high-temperature x-ray analysis of both SrRuO3 thin films and powders was conducted. Structural phase transitions were found at temperatures near 350°C and slightly above 600°C. The transitions are tentatively indexed as orthorhombic to tetragonal and tetragonal to cubic, respectively. These results suggest that SrRuO3 thin films grow with cubic symmetry. As such, film-substrate interfacial characteristics, rather than a preferred growth direction, are believed to determine the orientation of orthorhombic twins.

Original languageEnglish (US)
Pages (from-to)3382-3384
Number of pages3
JournalApplied Physics Letters
Volume76
Issue number23
DOIs
StatePublished - Jun 5 2000

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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