Oxide superconductor interfaces studied by spectroscopic ellipsometry

B. J. Gibbons, S. Trolier-McKinstry, D. G. Schlom, C. B. Eom

Research output: Contribution to journalConference article

2 Citations (Scopus)

Abstract

In the eight years since its discovery, numerous materials have been identified as being compatible with YBa2Cu3O7-δ (YBCO). Investigation of potentially compatible compounds requires a knowledge of both the chemistry and microstructure of the interface between the superconductor and the material. In this work, spectroscopic ellipsometry (SE) is being developed as a rapid and non-destructive characterization tool for investigating these interfaces. In addition, SE was used to determine reference optical data for common YBCO substrate materials. These include BaZrO3, 9.5 mol% Y2O3-ZrO2 (YSZ), NdGaO3 and LaSrGaO4. SE measurements of epitaxial YBCO on YSZ substrates have shown that it is possible to identify the formation of the known BaZrO3 reaction layer. The modeled thickness of the reaction layer, as well as the modeled thickness of the YBCO film, are as expected. SE measurements as a function of temperature for YBCO/SrTiO3 have also been obtained. The SE data shows dramatic changes from room temperature to high temperature. This is due to the strong dependence of the dielectric function of YBCO on the oxygen content of the film.

Original languageEnglish (US)
Pages (from-to)333-338
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
Volume401
StatePublished - Jan 1 1996
EventProceedings of the 1995 MRS Fall Symposium - Boston, MA, USA
Duration: Nov 27 1995Dec 1 1995

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Oxide superconductors
Spectroscopic ellipsometry
ellipsometry
oxides
yttria-stabilized zirconia
Substrates
Temperature
Superconducting materials
barium copper yttrium oxide
chemistry
microstructure
Microstructure
Oxygen
room temperature
oxygen

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

@article{dea68104065948199a230a4a9cc49c6c,
title = "Oxide superconductor interfaces studied by spectroscopic ellipsometry",
abstract = "In the eight years since its discovery, numerous materials have been identified as being compatible with YBa2Cu3O7-δ (YBCO). Investigation of potentially compatible compounds requires a knowledge of both the chemistry and microstructure of the interface between the superconductor and the material. In this work, spectroscopic ellipsometry (SE) is being developed as a rapid and non-destructive characterization tool for investigating these interfaces. In addition, SE was used to determine reference optical data for common YBCO substrate materials. These include BaZrO3, 9.5 mol{\%} Y2O3-ZrO2 (YSZ), NdGaO3 and LaSrGaO4. SE measurements of epitaxial YBCO on YSZ substrates have shown that it is possible to identify the formation of the known BaZrO3 reaction layer. The modeled thickness of the reaction layer, as well as the modeled thickness of the YBCO film, are as expected. SE measurements as a function of temperature for YBCO/SrTiO3 have also been obtained. The SE data shows dramatic changes from room temperature to high temperature. This is due to the strong dependence of the dielectric function of YBCO on the oxygen content of the film.",
author = "Gibbons, {B. J.} and S. Trolier-McKinstry and Schlom, {D. G.} and Eom, {C. B.}",
year = "1996",
month = "1",
day = "1",
language = "English (US)",
volume = "401",
pages = "333--338",
journal = "Materials Research Society Symposium - Proceedings",
issn = "0272-9172",
publisher = "Materials Research Society",

}

Oxide superconductor interfaces studied by spectroscopic ellipsometry. / Gibbons, B. J.; Trolier-McKinstry, S.; Schlom, D. G.; Eom, C. B.

In: Materials Research Society Symposium - Proceedings, Vol. 401, 01.01.1996, p. 333-338.

Research output: Contribution to journalConference article

TY - JOUR

T1 - Oxide superconductor interfaces studied by spectroscopic ellipsometry

AU - Gibbons, B. J.

AU - Trolier-McKinstry, S.

AU - Schlom, D. G.

AU - Eom, C. B.

PY - 1996/1/1

Y1 - 1996/1/1

N2 - In the eight years since its discovery, numerous materials have been identified as being compatible with YBa2Cu3O7-δ (YBCO). Investigation of potentially compatible compounds requires a knowledge of both the chemistry and microstructure of the interface between the superconductor and the material. In this work, spectroscopic ellipsometry (SE) is being developed as a rapid and non-destructive characterization tool for investigating these interfaces. In addition, SE was used to determine reference optical data for common YBCO substrate materials. These include BaZrO3, 9.5 mol% Y2O3-ZrO2 (YSZ), NdGaO3 and LaSrGaO4. SE measurements of epitaxial YBCO on YSZ substrates have shown that it is possible to identify the formation of the known BaZrO3 reaction layer. The modeled thickness of the reaction layer, as well as the modeled thickness of the YBCO film, are as expected. SE measurements as a function of temperature for YBCO/SrTiO3 have also been obtained. The SE data shows dramatic changes from room temperature to high temperature. This is due to the strong dependence of the dielectric function of YBCO on the oxygen content of the film.

AB - In the eight years since its discovery, numerous materials have been identified as being compatible with YBa2Cu3O7-δ (YBCO). Investigation of potentially compatible compounds requires a knowledge of both the chemistry and microstructure of the interface between the superconductor and the material. In this work, spectroscopic ellipsometry (SE) is being developed as a rapid and non-destructive characterization tool for investigating these interfaces. In addition, SE was used to determine reference optical data for common YBCO substrate materials. These include BaZrO3, 9.5 mol% Y2O3-ZrO2 (YSZ), NdGaO3 and LaSrGaO4. SE measurements of epitaxial YBCO on YSZ substrates have shown that it is possible to identify the formation of the known BaZrO3 reaction layer. The modeled thickness of the reaction layer, as well as the modeled thickness of the YBCO film, are as expected. SE measurements as a function of temperature for YBCO/SrTiO3 have also been obtained. The SE data shows dramatic changes from room temperature to high temperature. This is due to the strong dependence of the dielectric function of YBCO on the oxygen content of the film.

UR - http://www.scopus.com/inward/record.url?scp=0029753045&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0029753045&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:0029753045

VL - 401

SP - 333

EP - 338

JO - Materials Research Society Symposium - Proceedings

JF - Materials Research Society Symposium - Proceedings

SN - 0272-9172

ER -