P1-31: Enhancement and trajectory of field emission near the contact between metal and dielectric

Moon S. Chung, Alexander Mayer, Brock L. Weiss, Nicholas M. Miskovsky, Paul H. Cutler

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We have investigated the enhanced field emission observed at the contact between metal and dielectric. To describe the dielectric effect on the enhancement, we consider a two-dimensional quadruple junction consisted of metal, vacuum, dielectric, and vacuum. It is found that both field and field emission are more enhanced in the quadruple junction than in the triple junction. The enhanced field can be strong enough to produce space charges in dielectric, which yields a favorable detour trajectory of field electrons.

Original languageEnglish (US)
Title of host publication23rd International Vacuum Nanoelectronics Conference, IVNC 2010
Pages84-85
Number of pages2
DOIs
StatePublished - Oct 29 2010
Event23rd International Vacuum Nanoelectronics Conference, IVNC 2010 - Palo Alto, CA, United States
Duration: Jul 26 2010Jul 30 2010

Publication series

Name23rd International Vacuum Nanoelectronics Conference, IVNC 2010

Other

Other23rd International Vacuum Nanoelectronics Conference, IVNC 2010
CountryUnited States
CityPalo Alto, CA
Period7/26/107/30/10

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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    Chung, M. S., Mayer, A., Weiss, B. L., Miskovsky, N. M., & Cutler, P. H. (2010). P1-31: Enhancement and trajectory of field emission near the contact between metal and dielectric. In 23rd International Vacuum Nanoelectronics Conference, IVNC 2010 (pp. 84-85). [5563167] (23rd International Vacuum Nanoelectronics Conference, IVNC 2010). https://doi.org/10.1109/IVNC.2010.5563167