Particle charging in low-pressure plasmas

Themis Matsoukas, Marc Russell

Research output: Contribution to journalArticle

168 Citations (Scopus)

Abstract

Particles embedded in a plasma acquire a net charge as a result of collisions with electrons and ions. Due to the stochastic nature of encounters between particle and charged species, the instantaneous charge fluctuates. The static properties of the charge fluctuations are quantified for particles surrounded by an undisturbed plasma in orbital motion limit. For particles that satisfy the condition e2/4πε0RkTe≪1 the charge distribution is a Gaussian function whose average and variance is related to the ion and electron currents toward the particle. For a Maxwellian plasma, in particular, analytical solutions are developed for the average charge and the variance as a function of the parameters of the plasma n e/ni, Te/Ti, and M e/Mi. Finally, the methodology is extended to non-Maxwellian plasmas using the Druyvesteyn as an example.

Original languageEnglish (US)
Pages (from-to)4285-4292
Number of pages8
JournalJournal of Applied Physics
Volume77
Issue number9
DOIs
StatePublished - Dec 1 1995

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particle charging
low pressure
encounters
charge distribution
ion currents
electrons
methodology
orbits
collisions
ions

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Cite this

Matsoukas, Themis ; Russell, Marc. / Particle charging in low-pressure plasmas. In: Journal of Applied Physics. 1995 ; Vol. 77, No. 9. pp. 4285-4292.
@article{584c0ad18dc942d58211b3c74d80fc35,
title = "Particle charging in low-pressure plasmas",
abstract = "Particles embedded in a plasma acquire a net charge as a result of collisions with electrons and ions. Due to the stochastic nature of encounters between particle and charged species, the instantaneous charge fluctuates. The static properties of the charge fluctuations are quantified for particles surrounded by an undisturbed plasma in orbital motion limit. For particles that satisfy the condition e2/4πε0RkTe≪1 the charge distribution is a Gaussian function whose average and variance is related to the ion and electron currents toward the particle. For a Maxwellian plasma, in particular, analytical solutions are developed for the average charge and the variance as a function of the parameters of the plasma n e/ni, Te/Ti, and M e/Mi. Finally, the methodology is extended to non-Maxwellian plasmas using the Druyvesteyn as an example.",
author = "Themis Matsoukas and Marc Russell",
year = "1995",
month = "12",
day = "1",
doi = "10.1063/1.359451",
language = "English (US)",
volume = "77",
pages = "4285--4292",
journal = "Journal of Applied Physics",
issn = "0021-8979",
publisher = "American Institute of Physics Publising LLC",
number = "9",

}

Particle charging in low-pressure plasmas. / Matsoukas, Themis; Russell, Marc.

In: Journal of Applied Physics, Vol. 77, No. 9, 01.12.1995, p. 4285-4292.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Particle charging in low-pressure plasmas

AU - Matsoukas, Themis

AU - Russell, Marc

PY - 1995/12/1

Y1 - 1995/12/1

N2 - Particles embedded in a plasma acquire a net charge as a result of collisions with electrons and ions. Due to the stochastic nature of encounters between particle and charged species, the instantaneous charge fluctuates. The static properties of the charge fluctuations are quantified for particles surrounded by an undisturbed plasma in orbital motion limit. For particles that satisfy the condition e2/4πε0RkTe≪1 the charge distribution is a Gaussian function whose average and variance is related to the ion and electron currents toward the particle. For a Maxwellian plasma, in particular, analytical solutions are developed for the average charge and the variance as a function of the parameters of the plasma n e/ni, Te/Ti, and M e/Mi. Finally, the methodology is extended to non-Maxwellian plasmas using the Druyvesteyn as an example.

AB - Particles embedded in a plasma acquire a net charge as a result of collisions with electrons and ions. Due to the stochastic nature of encounters between particle and charged species, the instantaneous charge fluctuates. The static properties of the charge fluctuations are quantified for particles surrounded by an undisturbed plasma in orbital motion limit. For particles that satisfy the condition e2/4πε0RkTe≪1 the charge distribution is a Gaussian function whose average and variance is related to the ion and electron currents toward the particle. For a Maxwellian plasma, in particular, analytical solutions are developed for the average charge and the variance as a function of the parameters of the plasma n e/ni, Te/Ti, and M e/Mi. Finally, the methodology is extended to non-Maxwellian plasmas using the Druyvesteyn as an example.

UR - http://www.scopus.com/inward/record.url?scp=36449008097&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=36449008097&partnerID=8YFLogxK

U2 - 10.1063/1.359451

DO - 10.1063/1.359451

M3 - Article

VL - 77

SP - 4285

EP - 4292

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

IS - 9

ER -