Patent citation recommendation for examiners

Tao Yang Fu, Zhen Lei, Wang-chien Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

There is a consensus that U. S. patent examiners, who are responsible for identifying prior art relevant to adjudicationof patentability of patent applications, often lack thetime, resources and/or experience necessary to conduct adequateprior art search. This study aims to build an automatic andeffective system of patent citation recommendation for patentexaminers. In addition to focusing on content and bibliographicinformation, our proposed system considers another importantpiece of information that is known by patent examiners, namely, applicant citations. We integrate applicant citations and bibliographicinformation of patents into a heterogeneous citationbibliographicnetwork. Based on this network, we explore metapathsbased relationships between a query patent application anda candidate prior patent and classify them into two categories:(1) Bibliographic meta-paths, (2) Applicant Bibliographic metapaths. We propose a framework based on a two-phase rankingapproach: the first phase involves selection of a candidate subsetfrom the whole U. S. patent data, and the second phase usessupervised learning models to rank prior patents in the candidatesubset. The results show that both bibliographic informationand applicant citation information are very useful for examinercitation recommendation, and that our approach significantlyoutperforms a search engine.

Original languageEnglish (US)
Title of host publicationProceedings - 15th IEEE International Conference on Data Mining, ICDM 2015
EditorsZhi-Hua Zhou, Charu Aggarwal, Hui Xiong, Alexander Tuzhilin, Xindong Wu
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages751-756
Number of pages6
ISBN (Electronic)9781467395038
DOIs
StatePublished - Jan 5 2016
Event15th IEEE International Conference on Data Mining, ICDM 2015 - Atlantic City, United States
Duration: Nov 14 2015Nov 17 2015

Publication series

NameProceedings - IEEE International Conference on Data Mining, ICDM
Volume2016-January
ISSN (Print)1550-4786

Other

Other15th IEEE International Conference on Data Mining, ICDM 2015
CountryUnited States
CityAtlantic City
Period11/14/1511/17/15

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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  • Cite this

    Fu, T. Y., Lei, Z., & Lee, W. (2016). Patent citation recommendation for examiners. In Z-H. Zhou, C. Aggarwal, H. Xiong, A. Tuzhilin, & X. Wu (Eds.), Proceedings - 15th IEEE International Conference on Data Mining, ICDM 2015 (pp. 751-756). [7373384] (Proceedings - IEEE International Conference on Data Mining, ICDM; Vol. 2016-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICDM.2015.151